Welcome to Takahashi's Home Page

(Japanese/English)

Name Takuji TAKAHASHI
Present
Status
Professor,
Institute of Industrial Science (IIS),
University of Tokyo
Degree Doctor of Engineering
Biography
Research
Area

Nano-probing Technologies using Scanning Probe Microscopes 

  • Scanning Prove Microscopy (SPM) under Laser Irradiation
  • Electrostatic Force Measurements by Atomic Force Microscopy (AFM) with a Conductice Tip
  • Surface Potential Measurements on Semiconductors by Kelvin Probe Force Microscopy (KFM)
  • Non-contact and Local Current Detection by Magnetic Force Microscopy (MFM)
  • Development of Novel Methods for Scanning Tunneling Spectroscopy
  • Development of a novel STM using Semiconductor Tips

   (Publication List

Lectures

  • Graduate Course (Electrical Engineering and Information Systems):
    Solid State and Electronic Physics II
  • Graduate Course (Electrical Engineering and Information Systems):
    Special Lectures on Nano Quantum Information Electronics
Academic Societies
  • Japan Society of Applied Physics (JSAP)
  • The Institute of Electronics, Information and Communication Engineers (IEICE)
  • The Institute of Electrical Engineers of Japan


Address to Contact


Where to Go, Next?


TAKAHASHI, Takuji/ IIS, Univ. of Tokyo, JAPAN
takuji@iis.u-tokyo.ac.jp
(Last Modified : April 3, 2013)