| Name |
Takuji TAKAHASHI |
Present
Status |
Professor,
Institute of Industrial Science (IIS),
University of Tokyo |
| Degree |
Doctor of Engineering |
| Biography |
- Born in 1964
- BS degree in electronic
engineering in 1987
- MS degree in electronic
engineering in 1990
- Ph.D. degree in electronic
engineering in 1992
all from the University of Tokyo.
- 1992.4-1992.11 Lecturer, Institute
of Industrial Science (IIS), University of Tokyo
- 1992.11-1996.12 Lecturer, Research
Center for Advanced Science and Technology (RCAST), University
of Tokyo
- 1996.12-1999.12 Associate Professor,Research
Center for Advanced Science and Technology (RCAST), University
of Tokyo
- 2000.1- Associate Professor, Institute
of Industrial Science (IIS), University of Tokyo
- 2013.4- Professor, Institute
of Industrial Science (IIS), University of Tokyo
|
Research
Area |
Nano-probing Technologies using Scanning Probe Microscopes
- Scanning Prove Microscopy (SPM) under Laser Irradiation
- Electrostatic Force Measurements by Atomic Force Microscopy
(AFM) with a Conductice Tip
- Surface Potential Measurements on Semiconductors by Kelvin
Probe Force Microscopy (KFM)
- Non-contact and Local Current Detection by Magnetic Force Microscopy (MFM)
- Development of Novel Methods for Scanning Tunneling Spectroscopy
- Development of a novel STM using Semiconductor Tips
（Publication List）
|
|
Lectures |
- Graduate Course (Electrical Engineering and Information Systems):
Solid State and Electronic Physics
II - Graduate Course (Electrical Engineering and Information Systems):
Special Lectures on Nano Quantum Information Electronics
|
| Academic Societies |
- Japan Society of Applied Physics (JSAP)
- The Institute of Electronics, Information and Communication Engineers (IEICE)
- The Institute of Electrical Engineers of Japan
|