発表リスト

当研究室で行っている研究の紹介

学術誌

  1. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    “Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells”, Proceedings of the 7th Edition of the World Conference on Photovoltaic Energy Conversion (WCPEC-7) (2018).
  2. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Local Measurements of Surface Capacitance by Electrostatic Force Microscopy on Cu(In,Ga)Se2 Materials
    Proceedings of IEEE Photovoltaic Specialists Conference (PVSC-44) (2017).
  3. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Characterization of Surface Potential and Capacitance on CdS/Cu(In,Ga)Se2 Multi-layers by KFM and EFM
      Proceedings of 42th IEEE Photovoltaic Specialists Conference (PVSC 42) (2015).
  4. Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal Spectroscopy by Atomic Force Microscopy on Cu(In,Ga)Se2 Solar Cell Materials"
    , Solar Energy Materials and Solar Cells, 141, 32-38 (2015).
  5. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Electrostatic Force and Kelvin Probe Force Microscopies on Cu(In,Ga)Se2 Solar Cells
    Prceedings of 40th IEEE Photovoltaic Specialists Conference (PVSC 40), 3682-3684 (2014).
  6. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Processes in Cu(In,Ga)Se2 Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy
    Proceedings of 39th IEEE Photovoltaic Specialists Conference (PVSC 39), 1470-1472 (2013).
  7. Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal Spectroscopy by Atomic Force Microscopy on Cu(In,Ga)Se2 Solar Cells
    Proceedings of 39th IEEE Photovoltaic Specialists Conference (PVSC 39), 1691-1693 (2013).
  8. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "An Investigation of Band Profile around the Grain Boundary of Cu(InGa)Se2 Solar Cell Material by Scanning Probe Microscopy
    Prog. Photovolt: Res. Appl., 21, 595-599 (2013).
  9. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sampling Method in Atomic Force Microscopy",
    Proceedings of 38th IEEE Photovoltaic Specialists Conference (PVSC 38) (2012).
  10. Yu Nakajima, Masaki Takihara, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy",
    Proceedings of 38th IEEE Photovoltaic Specialists Conference (PVSC 38) (2012).
  11. Kenji Hara and Takuji Takahashi:
    "Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy",
    Appl. Phys. Express, 5, 022301 (2012).
  12. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "An Investigation of Band Profile around the Grain Boundary of Cu(InGa)Se2 Solar Cell Material by Scanning Probe Microscopy",
    Prog. Photovolt: Res. Appl. [Published online: Nov. 16 (2011)].
  13. Takuji Takahashi:
    "Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials",
    Jpn. J. Appl. Phys., 50, 08LA05 (2011).
  14. Shuichi Katsui and Takuji Takahashi:
    "Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy",
    Jpn. J. Appl. Phys., 50, 08LB08 (2011).
  15. Kenji Hara and Takuji Takahashi:
    "Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material",
    Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC), 1387-1389 (2010).
  16. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Characterized by Scanning Probe Microscopy",
    Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC), 2512-2515 (2010).
  17. Masayuki Ato, Takuji Takahashi, Yuki Okigawa, and Takashi Mizutani:
    "Conductance of Individual Channels in a Carbon Nanotube Field-effect Transistor Studied by Magnetic Force Microscopy",
    J. Appl. Phys., 106, 114315 (2009).
  18. Masaki Takihara, Takuji Takahashi, and Toru Ujihara:
    "Study of Minority Carrier Diffusion Length in Multicrystalline Silicon Solar Cells Using Photoassisted Kelvin Probe Force Microscopy",
    Appl. Phys. Lett., 95, 191908 (2009).
  19. Shuichi Katsui and Takuji Takahashi:
    "Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires",
    Jpn. J. Appl. Phys., 48, 08JB03 (2009).
  20. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy",
    Jpn. J. Appl. Phys., 48, 08JB22 (2009).
  21. . Takuji Takahashi, Tadahisa Matsumoto, and Shiano Ono:
    "Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection",
    Ultramicroscopy 109, 963-967 (2009).
  22. Masaki Takihara, Takuji Takahashi, and Toru Ujihara:
    "Minority Carrier Lifetime in Polycrystalline Silicon Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy",
    Appl. Phys. Lett., 93, 021902 (2008).
  23. Masato Ohmori, Takuya Kawazu, Kousuke Torii, Takuji Takahashi, and Hiroyuki Sakaki:
    "Formation of Ultra-low Density (104 cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method",
    Appl. Phys. Express, 1, 061202 (2008).
  24. Daisuke Saida, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Quantitative Current Evaluation Through Magnetic Field Detection by Magnetic Force Microscopy",
    IEEE Trans. Magn., 44, 1779-1784 (2008).
  25. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever",
    Jpn. J. Appl. Phys., 46, 5548-5551 (2007).
  26. Takuji Takahashi:
    "Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials",
    Proceedings on 6th Pacific Rim Conference on Ceramic and Glass Technology, 163 (2006).
  27. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
    Jpn. J. Appl. Phys., 45, 1931-1933 (2006).
  28. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezo-resistive Cantilever",
    Jpn. J. Appl. Phys., 45, 2128-2131 (2006).
  29. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    Jpn. J. Appl. Phys., 44, 8625-8629 (2005).
  30. Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
    "Local Photocurrent Detection on InAs Wires by Conductive AFM",
    Ultramicroscopy, 105, 137-142 (2005).
  31. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Atomic Force Microscopy for Fast Operation",
    Ultramicroscopy, 105, 42-50 (2005).
  32. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Operation in Kelvin Probe Force Microscopy",
    Jpn. J. Appl. Phys., 44, 6213-6217 (2005).
  33. Takuji Takahashi and Shiano Ono:
    "Tip-to-sample Distance Dependence of an Electrostatic Force in KFM Measurements",
    Ultramicroscopy, 100, 287-292 (2004).
  34. Takuji Takahashi and Daisuke Saida:
    "Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy",
    Ultramicroscopy, 100, 293-299 (2004).
  35. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
    Jpn. J. Appl. Phys., 43, 4612-4614 (2004).
  36. Shiano Ono and Takuji Takahashi:
    "Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy",
    Jpn. J. Appl. Phys., 43, 4639-4642 (2004).
  37. Daisuke Saida and Takuji Takahashi:
    "Magnetic Field Observation Around Current Path by Magnetic Force Microscopy",
    Jpn. J. Appl. Phys., 43, 4643-4646 (2004).
  38. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy",
    Jpn. J. Appl. Phys., 43, L582-L584 (2004).
  39. Shiano Ono, Misaichi Takeuchi, Takeshi Noda, and Takuji Takahashi:
    "Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy",
    Jpn. J. Appl. Phys., 42, 4869-4873 (2003).
  40. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
    Jpn. J. Appl. Phys., 42, 4874-4877 (2003).
  41. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
    Ultramicroscopy, 97, 1-6 (2003).
  42. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscope",
    Jpn. J. Appl. Phys., 41, 4990-4993 (2002).
  43. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Nanowires by Contact-mode Atomic Force Microscopy and Kelvin Probe Force Microscopy",
    Ultramicroscopy, 91, 127-132 (2002).
  44. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Kelvin Probe Force Microscopy on InAs Thin Films Grown on GaAs Giant Step Structures Formed on (110) GaAs Vicinal Substrates",
    Appl. Phys. Lett., 78, 1086-1088 (2001).
  45. Hiroshi Yamamoto, Takuji Takahashi, and Itaru Kamiya:
    "Local Capacitance Measurements on InAs dot-covered GaAs Surfaces by Scanning Capacitance Microscopy",
    Appl. Phys. Lett., 77, 1994-1996 (2000).
  46. Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
    "Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
    Jpn. J. Appl. Phys., 39, 3721-3723 (2000).
  47. Takuji Takahashi and Takashi Kawamukai:
    "Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
    Ultramicroscopy, 82, 63-68 (2000).
  48. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Electrostatic Force Characterization on InAs Dot-covered n-type (001) GaAs Surfaces by Contact-mode Atomic Force Microscopy with a Conductive Tip",
    Appl. Phys. Lett., 75, 510-512 (1999).
  49. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Characterization of InAs Dots on n-GaAs by AFM with a Conductive Tip",
    Surface and Interface Analysis, 27, 547-549 (1999).
  50. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Photoinduced Current Properties of InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
    Jpn. J. Appl. Phys., 38, 3871-3874 (1999).
  51. Takuji Takahashi, Masahiro Yoshita, Itaru Kamiya, and Hiroyuki Sakaki:
    "Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation",
    Appl. Phys. A, 66, S1055-S1058 (1998).
  52. Takuji Takahashi and Masahiro Yoshita:
    "Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation",
    Appl. Phys. Lett., 70, 2162-2164 (1997).
  53. Masahiro Yoshita and Takuji Takahashi:
    "Characterization of Cleaved GaAs Tips for Scanning Tunneling Microscopy",
    Jpn J. Appl. Phys., 36, 6957-6961 (1997).
  54. Masahiro Yoshita and Takuji Takahashi:
    "Photoreflectance Spectra from a Surface and an Interface of n-type GaAs Epitaxial Layers and Their Modulation Frequency Dependence",
    Appl. Surf. Sci., 115, 347-354 (1997).
  55. Takuji Takahashi and Masahiro Yoshita:
    "Laser Irradiation Effects on Tunneling Properties of n-type GaAs and InAs by Scanning Tunneling Microscopy",
    Appl. Phys. Lett., 68, 3479-3481 (1996).
  56. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Scanning Tunneling Microscopy of Undoped GaAs/AlGaAs Heterostructures under Laser Irradiation",
    Appl. Phys. Lett., 68, 502-504 (1996).

国際会議

  1. Ryota Fukuzawa and Takuji, Takahashi:
    "High frequency \(\partial C/\partial V \) measurements by dual bias modulation EFM",
    ACSIN-14 & ICSPM26, Sendai International Center, Sendai, Japan, October (2018).
  2. Takuji Takahashi:
    “Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells”,
    The 3rd international symposium on “Recent Trends in Elucidation and Function Discovery on Next Generation Functional Materials ・ Surface/Interface Properties”, Osaka, Japan, June (2018). [Invited]
  3. Ryota Fukuzawa and Takuji, Takahashi:
    “Frequency response measurements of \(\partial C/\partial V\) by electrostatic force microscopy on \(\mathrm{Cu(In,Ga)(S,Se)_2}\) solar cells”,
    Nano and Energy mini-Workshop Tokyo, Japan, July,( 2018).
  4. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    “Dependence of Photovoltage on Incident Photon Energies Investigated by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
    the 7th Edition of the World Conference on Photovoltaic Energy Conversion (WCPEC-7), Hawaii, U.S.A., June (2018).
  5. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    “Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells under Light with Various Photon Energies",
    The 20th International Scanning Probe Microscopy Conference (ISPM 2018), Tempe, U.S.A., May (2018).
  6. Takuji Takahashi:
    “Photo-assisted Scanning Probe Methods on Solar Cells",
    LIMMS/CNRS-IIS and UTC Joint Workshop, Compiègne, France, April (2018).[Invited]
  7. Risa Komatsu, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal-mode AFM on Cu(In,Ga)Se2 Materials",
    25th International Colloquium on Scanning Probe Microscopy (ICSPM25), S4-68,Atagawa, Japan December (2017).
  8. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photo-carrier Recombination Properties in Cu(In,Ga)Se2 Solar Cells Investigated by Photo-assisted KFM under Various Illumination Conditions",
    25th International Colloquium on Scanning Probe Microscopy (ICSPM25), S4-66, Atagawa, Japan December (2017).
  9. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Local Measurements of Surface Capacitance by Electrostatic Force Microscopy on Cu(In,Ga)Se2 Materials",
    IEEE Photovoltaic Specialists Conference (PVSC-44), D35, Washington D.C., U.S.A., June (2017).
  10. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltaic Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted KFM under Various Illumination Conditions",
    International Scanning Probe Microscopy Conference (Kyoto 2017), WeP-29, Kyoto, Japan, May (2017).
  11. Risa Komatsu, Yasushi Hamamoto, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal Measurements by AFM on Cu(In,Ga)Se2 Materials",
    International Scanning Probe Microscopy Conference (Kyoto 2017), WeP-30, Kyoto, Japan, May (2017).
  12. Takuji Takahashi:
    "Photo-assisted Scanning Probe Methods on Solar Cells",
    LIMMS/FEMTO-ST Workshop, Besancon, France, February (2017).
  13. Takuji Takahashi:
    "Photo‐assisted Scanning Probe Microscopies on Solar Cell Materials",
    The 2nd International Symposium on "Recent Trends in Analysis Techniques for Functional Materials and Devices",
    29, Osaka, Japan, January (2017).[Invited]
  14. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photo-assisted KFM under Lights with Various Photon Energies on Cu(In,Ga)Se2 Solar Cells",
    24th International Colloquium on Scanning Probe Microscopy (ICSPM24), S6-6, Hawaii, U.S.A., December (2016).
  15. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Electrostatic Force Microscopy on Cu(In,Ga)Se2 Solar Cell Materials",
    24th International Colloquium on Scanning Probe Microscopy (ICSPM24), S4-20, Hawaii, U.S.A., December (2016).
  16. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltaic measurements on Cu(In,Ga)Se2 solar cells by photoassisted Kelvin probe force microscopy",
    20th International Vacuum Congress (IVC-20) / International Conference on Nanoscience and Technology (ICN+T 2016), NS-21-3-O-F, Busan, Korea, August (2016).
  17. Tomoaki Ishii, Takashi Minemoto, Takuji Takahashi:
    "Electrostatic Force Microscopy on Cu(In,Ga)Se2 Materials",
    International Scanning Probe Microscopy Conference (ISPM 2016), Grindelwald, Switzerland, June (2016).
  18. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Depletion Capacitance on Cd-diffused Cu(In,Ga)Se2 Measured by EFM",
    23rd International Colloquium on Scanning Probe Microscopy (ICSPM23), S7-3, Niseko, Japan, Desember (2015).
  19. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltaic Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted KFM under Lights with Various Photon Energies",
    23rd International Colloquium on Scanning Probe Microscopy (ICSPM23), S4-18, Niseko, Japan, December (2015).
  20. Hyeon Deuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Dependence of Photovoltage on Incident Light Wavelength Investigated by Photo-Assisted Kelvin Probe Force Microscopy on u(In,Ga)Se2 Solar Cells",
    31st European PV Solar Energy Conference and Exhibition (EU-PVSEC), 3CO.6.1, Hamburg, Germany, September (2015).
  21. Takuji Takahashi, Hyeondeuk Yong, Yasushi Hamamoto, Tomoaki Ishii, Warithapol Srivises, and Takashi Minemoto:
    "Photo-assisted Scanning Probe Microscopies on CIGS Solar Cells",
    Energy Materials Nanotechnology (EMN) Istanbul Meeting, C10, Istanbul, Turkey, July (2015).[Invited]
  22. Takuji Takahashi:
    "Photo-assisted SPMs on Solar Cell Materials",
    International Scanning Probe Microscopy Conference 2015 (ISPM), Rio De Janeiro, Brazil, June (2015).[Invited]
  23. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Characterization of Surface Potential and Capacitance on CdS/Cu(In,Ga)Se2 Multi-layers by KFM and EFM",
    42nd IEEE Photovoltaic Specialists Conference (PVSC-42), New Orleans, U.S.A. (2015).
  24. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Surface Potential and Capacitance on CdS/Cu(In,Ga)Se2 Multi-layers Characterized by Kelvin Probe Force Microscopy",
    22nd International Colloquium on Scanning Probe Microscopy(ICSPM22), S2-5, Atagawa, Japan (2014).
  25. Hyeondeuk Yong, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Measurements by Photo-assisted KFM on Cu(In,Ga)Se2 Solar Cells under Light Illumination with Various Wavelengths",
    22nd International Colloquium on Scanning Probe Microscopy(ICSPM22), S2-4, Atagawa, Japan (2014).
  26. Takuji Takahashi:
    "Photothermal Measurements by Atomic Force Microscopy on Cu(In,Ga)Se2 Solar Cell Materials with Various Ga Contents",
    29th European PV Solar Energy Conference and Exhibition (EU PVSEC 2014), 3DV.1.9, Amsterdam, The Netherlands, September (2014).
  27. Takuji Takahashi:
    "Photo-assisted scanning probe microscopy on CIGS solar cells",
    19th International Conference on Ternary and Multinary Compounds (ICTMC-19), S-3A, Niigata, Japan, September (2014).[Invited]
  28. Warithapol Srivises, Yasushi Hamamoto, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal Spectroscopy by AFM on Cu(In,Ga)Se2 Solar Cell Materials with Various Ga Contents",
    International Conference on Nanoscience and Technology (ICN+T 2014), NM3-MoM7, Vail, U.S.A., July (2014).
  29. Takuji Takahashi:
    "Photo-assisted scanning probe microscopy on CIGS solar cells",
    KOREA-FRANCE Joint Symposium 2014, PV-1, Seoul, Korea, June (2014).[Invited]
  30. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Electrostatic Force and Kelvin Probe Force Microscopies on Cu(In,Ga)Se2 Solar Cells",
    40th IEEE Photovoltaic Specialists Conference (PVSC 40), #1048, Denver, U.S.A., June (2014).
  31. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage decay processes investigated by photo-assisted Kelvin Probe force microscopy on Cu(In,Ga)Se2 solar cells",
    International Scanning Probe Microscopy Confeerence 2014 (ISPM), Seoul, Korea, June (2014).
  32. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Characterization of Cu(In,Ga)Se2 Solar Cells by Kelvin Probe Force Microscopy Under Dark and Illuminated Conditions" International Scanning Probe Microscopy Confeerence 2014 (ISPM), Seoul, Korea, June (2014).
  33. Tomoaki Ishii, Takashi Minemoto, and Takuji Takahashi:
    "Characterization of Cu(In,Ga)Se2 Solar Cells by Kelvin Probe Force Microscopy and Electrostatic Force Microscopy",
    12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12) & 21st International Colloquium on Scanning Probe Microscopy (ICSPM21), 8aD2-4, Tsukuba, Japan, November (2013).
  34. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photo-carrier Dynamics on Cu(In,Ga)Se2 Solar Cell Studied by Photo-assisted Kelvin Probe Force Microscopy",
    12th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-12) & 21st International Colloquium on Scanning Probe Microscopy (ICSPM21), 7pD1-4, Tsukuba, Japan, November (2013).
  35. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Processes in Cu(In,Ga)Se2 Solar Cells Investigated by Photo-assisted Kelvin Probe Force Microscopy",
    2013 JSAP-MRS Joint Symposia, 20a-M2-6, Doshisha Univ.,Kyoto, Japan, September (2013).
  36. Takuji Takahashi, Yasushi Hamamoto, Hyeondeuk Yong, and Takashi Minemoto:
    "Photovoltaic Measurements by P-KFM and Photothermal Spectroscopy by AFM on Cu(In,Ga)Se2 Solar Cell Materials",
    International Conference on Nanoscience + Technology 2013, Paris, France, September (2013).
  37. Hyeondeuk Yong, Yasushi Hamamoto, Takashi Minemoto, and Takuji Takahashi:
    "Photo-assisted SPMs on Cu(In,Ga)Se2 Solar Cell Materials",
    16th International Conference on Non-Contact Atomic Force Microscopy, Maryland, U.S.A., August (2013).
  38. Takuji Takahashi, Yasushi Hamamoto, Kenji Hara, and Takashi Minemoto:
    "Photothermal Spectroscopy by AFM on Cu(In,Ga)Se2 Solar Cells",
    The 15th International Scanning Probe Microscopy Conference, Dijon, France, July (2013).
  39. Takuji Takahashi, Hyeondeuk Yong, Yu Nakajima, and Takashi Minemoto:
    "Investigation of Photovoltage Decay Process in Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy",
    The 15th International Scanning Probe Microscopy Conference, Dijon, France, July (2013).
  40. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Processes in Cu(In,Ga)Se2 Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
    39th IEEE Photovoltaic Specialists Conference, #402-L12, Tampa, U.S.A., June (2013).
  41. Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi:
    "Photothermal Spectroscopy by Atomic Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
    39th IEEE Photovoltaic Specialists Conference, #472, Tampa, U.S.A., June (2013).
  42. Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Measurements by P-KFM on Cu(In,Ga)Se2 Solar Cells",
    20th International Colloquium on Scanning Probe Microscopy (ICSPM20), S10-1, Naha, Japan, December (2012).
  43. Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi:
    "Local Photothermal Measurements by AFM on Cu(In,Ga)Se2 Solar Cells",
    20th International Colloquium on Scanning Probe Microscopy (ICSPM20), S3-67, Naha, Japan, December (2012).
  44. Takuji Takahashi:
    "Photovoltage Decay Measurements by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
    4th Multifrequency AFM Conference, Oral 16, Madrid, Spain, October (2012).
  45. Kenji Hara and Takuji Takahashi:
    "Local Photothermal Measurement by AFM around Grain Boundaries in Multicrystalline Si Solar Cell",
    International Conference on Nanoscience + Technology (ICN+T2012), PO9.4, Paris, France, July (2012).
  46. Shuichi Katsui and Takuji Takahashi:
    "Photoinduced Current Measurements on InAs Wires by Dual Light Illumination Method in STM",
    International Conference on Nanoscience + Technology (ICN+T2012), SC-3.1, Paris, France, July (2012).
  47. Masaki Takihara, Kenji Hara, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:

    "Scanning Probe Analyses on Cu(In,Ga)Se2 Solar Cell Materials",
    Seeing at the Nanoscale 2012, Bristol, U.K., July (2012).
  48. Shuichi Katsui and Takuji Takahashi:
    "Photo-Induced Current Spectra on InAs Wires Measured by Dual Light Illumination Method in STM",
    The 14th International Scanning Probe Microscopy Conference (Toronto 2012), Toronto, Canada, June (2012).
  49. Takuji Takahashi, Yu Nakajima, Masaki Takihara, and Takashi Minemoto:
    "Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",(Invited)
    The 14th International Scanning Probe Microscopy Conference (Toronto 2012), Toronto, Canada, June (2012).
  50. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sampling Method in Atomic Force Microscopy",
    38th IEEE Photovoltaic Specialists Conference (PVSC 38), 354, Austin, U.S.A., June (2012).
  51. Yu Nakajima, Masaki Takihara, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy",
    38th IEEE Photovoltaic Specialists Conference (PVSC 38), 508, Austin, U.S.A., June (2012).
  52. Kenji Hara and Takuji Takahashi:
    "Local Photothermal Measurement by AFM under Near-Infrared Light around Grain Boundaries in Multicrystalline Si Solar Cell",
    19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S6-8, Toyako, Japan, December (2011).
  53. Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
    "Photovoltage Decay Investigated by Photoassisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
    19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S6-1, Toyako, Japan, December (2011).
  54. Shuichi Katsui and Takuji Takahashi:
    "Photoinduced Current Spectra on InAs Wires Observed by Dual Light Illumination Method in STM",
    19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S-4, Toyako, Japan, December (2011).
  55. Kenji Hara and Takuji Takahashi:
    "Photothermal Signals on Multicrystalline Silicon Solar Cells Measured by Dual Sampling Method in Atomic Force Microscopy",
    16th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP16), IX.T.3(16724), Merida, Mexico, November (2011).
  56. Shuichi Katsui and Takuji Takahashi:
    "Investigation of Photoabsorption Properties of Individual InAs Wire Structures through Scanning Tunneling Microscopy",
    International Workshop on Quantum Nanostructures and Nanoelectronics (QNN2011), P-39, Tokyo, Japan, October (2011).
  57. Sho Tanabe, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
    "Recognition of Current Routes in Multiple Channel CNT-FET by Scanning Probe Microscopies",
    International Workshop on Quantum Nanostructures and Nanoelectronics (QNN2011), Tu-8, Tokyo, Japan, October (2011).
  58. Kenji Hara and Takuji Takahashi:
    "Local Characterization of Multicrystalline Silicon Solar Cells through Photothermal and Potential Measurements by Scanning Probe Microscopy",
    2011 International Conference on Solid State Devices and Materials (SSDM 2011), L-9-2, Nagoya, Japan, September (2011).
  59. Shuichi Katsui and Takuji Takahashi:
    "Photoabsorption Properties in InAs Wires Characterized by Dual Light Illumination Method in Scanning Tunneling Microscopy",
    Seeing at the Nanoscale 2011, P89, Santa Barbara, U.S.A., July (2011).
  60. Kenji Hara and Takuji Takahashi:
    "Photothermal and Potential Measurements by SPM around Grain Boundaries in Multicrystalline Si Solar Cells",
    Seeing at the Nanoscale 2011, P107, Santa Barbara, U.S.A., July (2011).
  61. Kenji Hara and Takuji Takahashi:
    "Photothermal and Potential Properties Investigated by SPMs around Grain Boundary in Multicrystalline Si Solar Cell",
    International Scanning Probe Microscopy Conference (ISPM 2011), P20, Munich, Germany, June (2011).
  62. Shuichi Katsui and Takuji Takahashi:
    "Photoabsorption Properties in InAs Wire Structures Investigated by Scanning Tunneling Microscopy with Dual Light Illumination Method",
    International Scanning Probe Microscopy Conference (ISPM 2011), P19, Munich, Germany, June (2011).
  63. Shou Tanabe, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
    "Recognition of Current Routes in Multiple Channel CNT-FET by SPMs",
    International Scanning Probe Microscopy Conference (ISPM 2011), Munich, Germany, June (2011).
  64. Kenji Hara and Takuji Takahashi:
    "Local Photothermal Analysis around Grain Boundary in Multicrystalline Si Solar Cell by Atomic Force Microscopy",
    International Workshop on Scanning Probe Microscopy for Energy Applications 2011, P20, Mainz, Germany, June (2011).
  65. Takuji Takahashi:
    "Characterization of Solar Cell Materials by SPMs",(Invited)
    International Workshop on Scanning Probe Microscopy for Energy Applications 2011, Mainz, Germany, June (2011).
  66. Takuji Takahashi, Masayuki Ato, Sho Tanabe, Yuki Okigawa, and Takashi Mizutani:
    "Channel Properties in Carbon Nanotube Field-effect Transistors Investigated by Magnetic Force Microscopy",
    IEEE International Magnetics Conference (INTERMAG 2011), ES-05, Taipei, Taiwan, April (2011).
  67. Shou Tanabe, Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
    "Recognition of Current Route in Multi-channel CNT-FET by MFM",
    18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S7-5, Atagawa, Japan, December (2010).
  68. Shuichi Katsui and Takuji Takahashi:
    "Anisotropic Photoabsorption in InAs Wire Structures Studied by STM under Light Illumination",
    18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S4-50, Atagawa, Japan, December (2010).
  69. Takuji Takahashi:
    "SPM Characterization of Solar Cell Materials",(Invited)
    18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), Atagawa, Japan, December (2010).
  70. Kenji Hara and Takuji Takahashi:
    "Photothermal and Potential Properties around Grain Boundary in Multicrystalline Si Solar Cell Studied by AFM",
    18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S4-47, Atagawa, Japan, December (2010).
  71. Takuji Takahashi:
    "Nano-probe Characterization of Multicrystalline Si Solar Cell Materials",(Invited)
    The Forum on the Science and Technology of Silicon Materials 2010, Okayama, Japan, November (2010).
  72. Kenji Hara and Takuji Takahashi:
    "Local Photothermal Analysis by Atomic Force Microscopy around Grain Boundary in Multicrystalline Si Solar Cell",
    The Forum on the Science and Technology of Silicon Materials 2010, P06, Okayama, Japan, November (2010).
  73. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopy by Atomic Force Microscopy on Crystalline Silicon Solar Cell Materials",
    2010 International Conference on Solid State Devices and Materials (SSDM 2010), I-8-6, Tokyo, Japan, September (2010).
  74. Shuichi Katsui and Takuji Takahashi:
    "Dependence of Photoabsorption Property on Incident Light Polarization Investigated by STM on InAs Wire Structures",
    18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), NST6-O-3, Beijing, P.R.China, August (2010).
  75. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopic Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material",
    18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), ASS/SS6-O-3, Beijing, P.R.China, August (2010).
  76. Takuji Takahashi, Masaki Takihara, Takashi Minemoto, and Youichi Wakisaka:
    "Scanning Probe Microscopy on Cu(InGa)Se2 Solar Cell Material to Analyze Band Profile around Grain Boundary",
    18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), ASS/SS4-O-4, Beijing, P.R.China, August (2010).
  77. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Characterized by Scanning Prove Microscopy",
    35th IEEE Photovoltaic Specialists Conference (PVSC), 622-F1, Honolulu, U.S.A., June (2010).
  78. Kenji Hara and Takuji Takahashi:
    "Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material",
    35th IEEE Photovoltaic Specialists Conference (PVSC), 317-K7, Honolulu, U.S.A., June (2010).
  79. Shunsuke Yamada and Takuji Takahashi:
    "Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by AFM with a Conductive Tip",
    The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-33, Sapporo, Japan, May (2010).
  80. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Investigated by Scanning Probe Microscopy",
    The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-26, Sapporo, Japan, May (2010).
  81. Shuichi Katsui and Takuji Takahashi:
    "Photoinduced Current Signal Excited by Linearly Polarized Light Studied by STM on InAs Wire Structures",
    The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-25, Sapporo, Japan, May (2010).
  82. Kenji Hara and Takuji Takahashi:
    "Local Photothermal Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material",
    The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), TuE-3, Sapporo, Japan, May (2010).
  83. Kenji Hara and Takuji Takahashi:
    "Nonradiative Recombination Property around Grain Boundary in Multicrystalline Silicon Materials Studied by Photothermal Measurements in AFM",
    17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S8-3, Atagawa, Japan, December (2009).
  84. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Grain Boundary Characteristics of Cu(InGa)Se2 Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy",
    17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S8-2, Atagawa, Japan, December (2009).
  85. Shuichi Katsui and Takuji Takahashi:
    "Photon Energy Dependence of Photoinduced Current Signal Studied by Dual Light Illumination Method in STM",
    17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S4-53, Atagawa, Japan, December (2009).
  86. Shunsuke Yamada and Takuji Takahashi:
    "Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by Noncontact AFM with a Conductive Tip",
    17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S4-43, Atagawa, Japan, December (2009).
  87. Kenji Hara and Takuji Takahashi:
    "Local Measurements of Photothermal Signals on Polycrystalline Silicon Materials by Dual Sampling Method in Atomic Force Microscopy",
    2009 International Conference on Solid State Devices and Materials (SSDM 2009), K-5-5L, Sendai, Japan, October (2009).
  88. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Potential Profiles around Grain Boundary Studied by Photoassisted Kelvin Probe Force Microscopy on Cu(InGa)Se2 Solar Cells",
    2009 International Conference on Solid State Devices and Materials (SSDM 2009), H-9-2, Sendai, Japan, October (2009).
  89. Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
    "Channel Property of Individual Carbon Nanotubes in a Field Effect Transistor Characterized by Magnetic Force Microscopy",
    International Conference on Carbon Nanostructured Materials (Cnano'09), O-10, Athen, Greece, October (2009).
  90. Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
    "Electrical Properties of Individual Carbon Nanotube Channels in a Field Effect Transistor Studied by Magnetic Force Microscopy",
    The International Symposium on Carbon Nanotube Nanoelectronics (CNTNE 2009), 2P-20, Matsushima, Japan, June (2009).
  91. Takuji Takahashi and Kenji Hara:
    "Photothermal Spectroscopy by Atomic Force Microscopy with Dual Sampling Method",
    XI International Scanning Probe Microscopy Conference (ISPM 2009), Ins8, Madrid, Spain, June (2009).
  92. Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
    "Characterization of Individual Carbon Nanotube Channels in a Field-effect Transistor by Means of Magnetic Force Microscopy",
    XI International Scanning Probe Microscopy Conference (ISPM 2009), Oral 35, Madrid, Spain, June (2009).
  93. Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
    "Photovoltaic Characterization of Cu(InGa)Se2 and Cu(InAl)Se2 Solar Cells by Photoassisted Kelvin Probe Force Microscopy",
    The 34th IEEE Photovoltaic Specialists Conference (PVSC 34), Philadelphia, U.S.A., June (2009).
  94. Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
    "Individual Channel Conductance in a Carbon Nanotube Field-effect Transistor Studied by Magnetic Force Microscopy",
    The International Magnetics Conference, (INTERMAG 2009), AB-04, Sacramento, U.S.A., May (2009).
  95. Masaki Takihara and Takuji Takahashi:
    "Photoassisted Kelvin Probe Force Microscopy for Measuring Minority Carrier Lifetime in Solar Cell Materials",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-26, Atagawa, Japan, (2008).
  96. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Multiple Characterization of Minority Carriers in Polycrystalline Silicon Solar Cells by Photoassisted Kelvin Probe Force Microscopy",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-25, Atagawa, Japan, December (2008).
  97. Kenji Hara and Takuji Takahashi:
    "Photothermal Spectroscopic Measurements by Dual Sampling Method in Atomic Force Microscopy",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-19, Atagawa, Japan, December (2008).
  98. Masayuki Ato and Takuji Takahashi:
    "FIB-processed Cantilever for Lowering Torsional Spring Constant",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-5, Atagawa, Japan, December (2008).
  99. Shuichi Katsui and Takuji Takahashi:
    "Dual Light Illumination Method in STM for Photo-induced Current Measurements on InAs Wires",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S8-4, Atagawa, Japan, December (2008).
  100. Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
    "Electrical Characterization by Magnetic Force Microscopy on Individual Channels in a Carbon Nanotube Field-Effect Transistor",
    16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S5-2, Atagawa, Japan, December (2008).
  101. Takuji Takahashi, Tadahisa Matsumoto, Daisuke Saida, and Shiano Ono:
    "Nano-probing Techniques for Electrical and Optical Characterization of Nanostructures",
    UC Santa Barbara - University of Tokyo Workshop, P-21, Santa Barbara, U.S.A., September (2008).
  102. Shuichi Katsui and Takuji Takahashi:
    "Photo-induced Signals on InAs Wires by STM under Light Illumination",
    UC Santa Barbara - University of Tokyo Workshop, P-31, Santa Barbara, USA, September (2008).
  103. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
    UC Santa Barbara - University of Tokyo Workshop, P-41, Santa Barbara, U.S.A., September (2008).
  104. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Investigated by Photo-assisted Kelvin Probe Force Microscopy",
    18th Workshop on Crystalline Silicon Solar Cells Modules:
    Materials and Processes, #1, Vail, U.S.A., August (2008).
  105. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Photo-assisted Kelvin Probe Force Microscopy for Investigating Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells",
    International Conference on Nanoscience+Technology (ICN+T 2008), SP-TuM11, Keystone, U.S.A., July (2008).
  106. Takuji Takahashi, T. Matsumoto, and Shiano Ono:
    "Intermittent Bias Application Method for High Performance KFM",
    International Conference on Nanoscience+Technology (ICN+T 2008), SP-TuM12, Keystone, USA, July (2008).
  107. Takuji Takahashi and Shuichi Katsui:
    "Photo-induced Signals on InAs Wires Studied by STM under Light Illumination",
    International Scanning Probe Microscopy Conference (Seattle 08), P-55, Seattle, U.S.A., June (2008).
  108. Takuji Takahashi, T. Matsumoto, and Shiano Ono:
    "Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection",
    International Scanning Probe Microscopy Conference (Seattle 08), P-18, Seattle, U.S.A., June (2008).
  109. Takuji Takahashi, M. Takihara, and Toru Ujihara:
    "Minority Carrier Dynamics in Polycrystalline Silicon Solar Cell Investigated by Photo-assisted Kelvin Probe Force Microscopy",
    International Scanning Probe Microscopy Conference (Seattle 08), O-7, Seattle, U.S.A., June (2008).
  110. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Diffusion Length, Lifetime and Mobility of Minority Carrier in Polycrystalline Silicon Solar Cells Measured by Photo-assisted Kelvin Probe Force Microscopy",
    The 4th Asian Conference on Crystal Growth and Crystal Technology (CGCT4), #437, Sendai, Japan, May (2008).
  111. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
    33rd IEEE Photovoltaic Specialists Conference (PVSC 33), #581, San Diego, U.S.A., May (2008).
  112. <
  113. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
    15th International Colloquium on Scanning Probe Microscopy (ICSPM 15), S10-5, Atagawa, Japan, December (2007).
  114. Tadahisa Matsumoto, Shiano Ono, and Takuji Takahashi:
    "Influence of a Long-range Feature of an Electrostatic Force and Effectiveness of Intermittent Bias Application Method in Kelvin Probe Force Microscopy",
    15th International Colloquium on Scanning Probe Microscopy (ICSPM 15), S4-79, Atagawa, Japan, December (2007).
  115. Shuichi Katsui and Takuji Takahashi:
    "Photo-induced Signals on InAs Wires Studied by UHV-STM",
    15th International Colloquium on Scanning Probe Microscopy (ICSPM15), S4-91, Atagawa, Japan, December (2007).
  116. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Dynamics in Polycristalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
    17th International Photovoltaic Science and Engineering Conference (PVSEC-17), 4P-P2-53, Fukuoka, Japan, December (2007).
  117. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy",
    22nd European Photovoltaic Solar Energy Conference (22nd EU-PVSEC), 1CV.2.12, Milano, Italy, September (2007).
  118. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy",
    17th International Vacuum Congress (IVC-17) / 13th International Conference on Surface Science (ICSS-13) / International Conference on Nano Science and Technology (ICN+T 2007), NSP1-84, Stockholm, Sweden, July (2007).
  119. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Minority Carrier Diffusion Length Measurements on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy",
    17th International Vacuum Congress (IVC-17) / 13th International Conference on Surface Science (ICSS-13) / International Conference on Nano Science and Technology (ICN+T 2007), NSP1-86, Stockholm, Sweden, July (2007).
  120. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells Studied by Kelvin Probe Force Microscopy",
    International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), OP3, Jeju, Korea, June (2007).
  121. Takuji Takahashi, Masaki Takihara, and Toru Ujihara:
    "Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cell Materials Evaluated through Surface Photovoltage Measurements by KelvinProbeForceMicroscopy",
    International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), PI-1-07, Jeju, Korea, June (2007).
  122. Takuji Takahashi:
    "Electrostatic Force Spectroscopy on Self-assembled InAs Quantum Dots",
    International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), PII-4-06, Jeju, Korea, June (2007).
  123. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    Nano and Giga Challenges in Electronics and Photonics (NGC 2007), P64, Phoenix, U.S.A., March (2007).
  124. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Quantitative Current Evaluation around Artificial Current Networks by Magnetic Force Microscopy",
    Nano and Giga Challenges in Electronics and Photonics (NGC 2007), P65, Phoenix, U.S.A., March (2007).
  125. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    14th International Colloquium on Scanning Probe Microscopy (ICSPM 14), S10-3, Atagawa, Japan, December (2006).
  126. Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
    "Local Measurements of Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy",
    14th International Colloquium on Scanning Probe Microscopy (ICSPM 14), S4-35p, Atagawa, Japan, December (2006).
  127. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    International Conference on Solid State Devices and Materials (SSDM2006), P-9-9, Yokohama, Japan, September (2006).
  128. Takuji Takahashi, Daisuke Saida, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Magnetic Force Microscopy around Artificial Current Networks for Quantitative Evaluation of Current",
    International Conference on Nanoscience and Technology (ICN+T 2006), P689, Basel, Switzerland, August (2006).
  129. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara:
    "Local Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    International Conference on Nanoscience and Technology (ICN+T 2006), P634, Basel, Switzerland, August (2006).
  130. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Quantitative Current Evaluation through Magnetic Field Detection by Magnetic Force Microscopy",
    Asia-Pacific Symposium on Applied Electromagnetics and Mechanics, B2-2, Sydney, Australia, July (2006).
  131. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Quantitative Evaluation of Current by Magnetic Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier 2006), Montpellier, France, June (2006) [Invited].
  132. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara:
    "Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier 2006), SPM-16, Montpellier, France, June (2006).
  133. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Quantitative Evaluation of Current through Magnetic Field Observation by Magnetic Force Microscopy",
    International Magnetics Conference (INTERMAG 2006), HD-06, San Diego, U.S.A., May (2006).
  134. Takuji Takahashi, Shiano Ono, Daisuke Saida, and Takatoshi Igarashi:
    "Nano-probing Techniques for Electrical and Optical Characterization of Nanostructures",
    International Symposium on Advanced Electronics for Future Generations, 1.6, Tokyo, Japan, October (2005).
  135. Takuji Takahashi:
    "Scanning Probe Methods for Characterization of Electrical Properties in Nano-materi(Invited)als" , 6th Pacific Rim Conference on Ceramic and Glass Technology (PacRim 6), PACRIM-EL2-6-2005, Maui, U.S.A., September (2005).
  136. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Quantitativeness in Current Evaluation through Current-induced Magnetic Field Detection by Magnetic Force Microscopy",
    The 23rd European Conference on Surface Science (ECOSS 23), Appl22, Berlin, Germany, September (2005).
  137. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Mon-5-C4, Sapporo, Japan, July (2005).
  138. Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
    "A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Mon-Pos-67, Sapporo, Japan, July (2005).
  139. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Ability in Quantitative Measurement of Current-Induced Magnetic Field by Magnetic Force Microscopy",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Tue-5-C2, Sapporo, Japan, July (2005).
  140. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Tue-Pos-80, Sapporo, Japan, July (2005).
  141. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Magnetic Field Detection by Magnetic Force Microscopy for Current Mapping with High Spatial Resolution",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P314, Stockholm, Sweden, June (2005).
  142. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Local Mapping of Photovoltages on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), O-141, Stockholm, Sweden, June (2005).
  143. Shiano Ono and Takuji Takahashi:
    "A New Approach for Improving Accuracy and Resolution in Surface Potential Measurements by Kelvin Probe Force Microscopy",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P312, Stockholm, Sweden, June (2005).
  144. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Current Evaluation through Current-induced Magnetic Field Detected by Magnetic Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-8, Cancun, Mexico, June (2005).
  145. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by AFM with Piezo-resistive Cantilever",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-31, Cancun, Mexico, June (2005).
  146. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application for Accurate Potential Determination in Kelvin Probe Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), Cancun, Mexico, June (2005).
  147. Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
    "A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-1, Cancun, Mexico, June (2005).
  148. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Current-induced Magentic Field Detection around Fine Current Paths by Magnetic Force Microscopy",
    International Magnetics Conference (INTERMAG 2005), EF-03, Nagoya, Japan, April (2005).
  149. Shiano Ono and Takuji Takahashi:
    "Potential Distribution around InAs Quantum Dots Observed by Sampling-and-Hold Kelvin Probe Force Microscopy",
    International Symposium on Quantum Dots and Photonic Crystals 2005 (ISQDPC 2005), P-19, Tokyo, Japan, March (2005).
  150. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    The 12th International Colloquium on Scanning Probe Microscopy, S1-4, Atagawa, Japan, December (2004).
  151. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
    The 12th International Colloquium on Scanning Probe Microscopy, S10-5, Atagawa, Japan, December (2004).
  152. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Kelvin Probe Force Microscopy",
    The 12th International Colloquium on Scanning Probe Microscopy, P-55, Atagawa, Japan, December (2004).
  153. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Local Photovoltage Mapping on Polycrystalline Silicon Solar Cells thorough Electrostatic Force Detected by AFM with Piezoresistive Cantilever",
    The 12th International Colloquium on Scanning Probe Microscopy, P-57, Atagawa, Japan, December (2004).
  154. Shiano Ono and Takuji Takahashi:
    "Sample-and-hold Kelvin probe force microscopy on InAs quantum dots towards accurate potential measurements",
    Frontiers in Nanoscale Science and Engineering, P-3, Boston, U.S.A., October (2004).
  155. Kan Takada, Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
    "Local Photoabsorption Measurements on InAs Wires by STM and Conductive AFM",
    Frontiers in Nanoscale Science and Engineering, P-13, Boston, U.S.A., October (2004).
  156. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
    Frontiers in Nanoscale Science and Engineering, P-19, Boston, U.S.A., October (2004).
  157. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Current-induced magnetic field detection by magnetic force microscopy for current evaluation",
    Frontiers in Nanoscale Science and Engineering, P-20, Boston, U.S.A., October (2004).
  158. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Differential Conductance Measurements in Scanning Tunneling Spectroscopy",
    Frontiers in Nanoscale Science and Engineering, P-21, Boston, U.S.A., October (2004).
  159. Shiano Ono and Takuji Takahashi:
    "Precise Potential Determination by Sample-and-Hold Kelvin Probe Force Microscopy",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP1, Venice, Italy, June (2004).
  160. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Operation in Atomic Force Microscopy for Fast Scanning",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP2, Venice, Italy, June (2004).
  161. Daisuke Saida and Takuji Takahashi:
    "A Novel Method of Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP3, Venice, Italy, June (2004).
  162. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Atomic Force Microscopy for Fast Operation",
    Beijing - TEDA 2004:
    Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).
  163. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Operation for Potential Determination in Kelvin Probe Force Microscopy",
    Beijing - TEDA 2004:
    Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).
  164. <
  165. Takuji Takahashi, Hiroyuki Masuda, and Misaichi Takeuchi:
    "Local Photocurrent Detection on InAs Wires by Conductive AFM",
    Beijing - TEDA 2004:
    Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).
  166. Daisuke Saida and Takuji Takahashi:
    "Magnetic Field Observation Around a Current Flow by Magnetic Force Microscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, S9-4, Atagawa, Japan, December (2003).
  167. Shiano Ono and Takuji Takahashi:
    "Size Dependence of Surface Potential on InAs Dots Studied by Kelvin Probe Force Microscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, S8-5, Atagawa, Japan, December (2003).
  168. Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
    "Local Detection of Photocurrent of InAs Wire by Conductive AFM Tip",
    The 11th International Colloquium on Scanning Probe Microscopy, S8-4, Atagawa, Japan, December (2003).
  169. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, P-36, Atagawa, Japan, December (2003).
  170. Shiano Ono and Takuji Takahashi:
    "Size Dependence of Surface Potential on InAs Quantum Dots",
    International Symposium on Quantum Dots and Photonic Crystals 2003 (QDPC2003), P-17, Tokyo, Japan, November (2003).
  171. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection around a GaAs/AlGaAs Mesa Stripe by Magnetic Force Microscopy",
    7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-7), 20B56, Nara, Japan, November (2003).
  172. Takuji Takahashi, Shiano Ono, Kan Takada, Daisuke Saida, and Hiroyuki Masuda:
    "Nanoscale Characterization of Electronic and Optical Properties in Nanostructures by Scanning Probe Methods",
    The 5th International Workshop on Future Information Precessing Technologies (IWFIPT 2003), Miyazaki, Japan, November (2003).
  173. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Influences of Tip-to-sample Distance on KFM Measurements",
    The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, July (2003).
  174. Daisuke Saida and Takuji Takahashi:
    "Low Current Detection by Magnetic Force Microscopy",
    The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, Netherland, July (2003).
  175. Takuji Takahashi, Kan Takada, Hiroyuki Masuda, and Misaichi Takeuchi:
    "Photo-induced Conductance Properties in InAs Nanostructures Studied by STM and AFM under Light Illumination",
    3rd International Symposium on Scanning Probe Spectroscopy and Related Methods (SPS'03), Poznan, Poland, July (2003).
  176. Takuji Takahashi and Daisuke Saida:
    "Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy",
    Oxford 2003:
    Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, U.K., May (2003).
  177. Takuji Takahashi and Shiano Ono:
    "Influences of Tip-Sample Distance on KFM Measurements",
    Oxford 2003:
    Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, U.K., May (2003).
  178. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Photo-absorption in InAs Nanostructures Studied by Light-illuminated STM",
    2nd International Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, Japan, November (2002).
  179. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
    The 10th International Colloquium on Scanning Probe Microscopy, S2-6, Hawaii, U.S.A., October (2002).
  180. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential Imaging on InAs Quantum Dots and InAs Thin Films by Kelvin Probe Force Microscopy Operated in High Vacuum",
    The 10th International Colloquium on Scanning Probe Microscopy, S6-7, Hawaii, U.S.A., October (2002).
  181. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential on InAs Quantum Dots Studied by Kelvin Probe Force Microscopy",
    2nd International Conference on Semiconductor Quantum Dots (QD2002), G-9, Tokyo, Japan, September (2002).
  182. Shiano Ono, Takuji Takahashi, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on Self-assembled InAs Dots and InAs Thin Film",
    The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-36, Tsukuba, Japan, September (2002).
  183. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field around a GaAs Mesa Stripe Studied by Magnetic Force Microscopy",
    The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-37, Tsukuba, Japan, September (2002).
  184. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Photoabsorption in Indium Arsenide Nanowires Studied by Light-illuminated STM",
    nano-7/ecoss-21:
    7th International Conference on Nanometer-scale Science and Technology/21th European Conference on Surface Science, TH-P-026, Malmoe, Sweden, June (2002).
  185. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
    Las Vegas 2002:
    Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, U.S.A., May (2002).
  186. Takuji Takahashi and Daisuke Saida:
    "Current Evaluation through Magnetic Field Measurement by Magnetic Force Microscopy",
    Las Vegas 2002:
    Scanning Probe Microscopy, Sensors and Nanostructures, P46, Las Vegas, U.S.A., May (2002).
  187. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Surface Potential Measurements on Self-assembled InAs Quantum Dots by Kelvin Probe Force Microscopy",
    Las Vegas 2002:
    Scanning Probe Microscopy, Sensors and Nanostructures, P65, Las Vegas, U.S.A., May (2002).
  188. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current Imaging on InAs Wires by Contact-mode AFM",
    The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (2001).
  189. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Photo-absorption Characterization on Surface InAs Nano-structures Using Light-illuminated STM",
    The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (2001).
  190. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Conductive AFM Characterization on InAs Wires Formed on (110) GaAs Vicinal Substrates",
    28th International Symposium on Compound Semiconductors (ISCS2001), Tokyo, Japan, October (2001).
  191. Kan Takada, Misaichi Takeuchi and Takuji Takahashi:
    "Light-illuminated STM Studies on InAs Nano-structures",
    The 2001 International Conference on Solid State Devices and Materials (SSDM2001), Tokyo, Japan, September (2001).
  192. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Wire-like Structures by AFM with a Conductive Tip",
    11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Vancouver, Canada, July (2001).
  193. Takuji Takahashi, Shiano Ono, Kan Takada, and Misaichi Takeuchi:
    "SPM Characterization of InAs Nano-wires Grown on GaAs (110) Vicinal Substrates" The First International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '01 (QNN '01), Tsukuba, Japan, July (2001).
  194. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on InAs Nanostructures" (Invited), Tokyo-2001:
    Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).
  195. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Wires by Contact-mode AFM and Kelvin Probe Force Microscopy",
    Tokyo-2001:
    Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).
  196. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Electronic Properties on GaAs Covered by InAs Nano-wires Studied by Light-illuminated STM",
    Tokyo-2001:
    Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).
  197. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential Measurements on InAs Nanostructures by Kelvin Probe Force Microscopy",
    The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, Japan, December (2000).
  198. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Capacitance and Conductance Measurements on Self-Assembled InAs Quantum Dots Studied by Scanning Capacitance Microscopy",
    The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, Japan, December (2000).
  199. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
    SSDM 2000:
    2000 International Conference on Solid State Devices and Materials, Sendai, Japan, August (2000).
  200. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Capacitance and Conductance Measurements of embedded InAs Quantum Dots in GaAs",
    The 2nd International Conference on Scanning Probe Spectroscopy, Hamburg, Germany, July (2000).
  201. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
    Heidelberg 2000:
    Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Heidelberg, Germany, May (2000).
  202. Takuji Takahashi, Takeshi Noda, and Hiroyuki Sakaki:
    "Surface Potential Distribution of a Thin InAs Layer on an (110) GaAs Substrate Studied by Kelvin Probe Force Microscopy",
    Surfaces and Interfaces of Mesoscopic Devices, Maui, U.S.A., December (1999).
  203. Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
    "Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).
  204. Daisuke Yashiki and Takuji Takahashi:
    "Scanning Tunneling Spectroscopy on Buried Quantum Well",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).
  205. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Local Capacitance Measurement on InAs-covered GaAs Studied by Scanning Capacitance Microscopy",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).
  206. Takuji Takahashi, Takeshi Noda, Takashi Kawamukai, and Hiroyuki Sakaki:
    "Kelvin Probe Microscopy on InAs Surfaces on (100) and (110) GaAs Substrates",
    Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, WePos1-7, Seoul, Korea, July (1999).
  207. Hiroshi Yamamoto and Takuji Takahashi:
    "Cross-sectional Observation of p-n GaAs Multilayers by STM under Laser Irradiation",
    Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, TuP1-25, Seoul, Korea, July (1999).
  208. Takuji Takahashi and Takashi Kawamukai:
    "Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
    Seattle'99:
    Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, U.S.A., May (1999).
  209. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Photoinduced Current on InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
    The 6th International Colloquium on Scanning Tunneling Microscopy, Atagawa, Japan, December (1998).
  210. Takuji Takahashi, Takashi Kawamukai, Hiroshi Yamamoto, and Itaru Kamiya:
    "Near Surface Electrical Characterization of Nanostructures by SPM Technolgies",
    2nd France-Japan Workshop from Nano to Macroscale Science and Technology through Microsystems, Toulouse, France, November (1998).
  211. <
  212. Takashi Kawamukai, Itaru Kamiya, and Takuji Takahashi:
    "Highly Resolved Surface Characterization of InAs-covered GaAs by AFM with a conductive tip",
    25th Internatinal Symposium on Compound Semiconductors, TuP-16, Nara, Japan, October (1998).
  213. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Characterization of InAs dots on n-GaAs by AFM with a conductive tip",
    3rd Conference on Development and Technological Application of Nearfield-Scanning Probe Methods, TueA11, Basel, Switzerland, September (1998).
  214. Takuji Takahashi and Masahiro Yoshita:
    "Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation",
    Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Tu11.2P30, Hamburg, Germany, July (1997).
  215. Takuji Takahashi and Masahiro Yoshita:
    "Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation",
    Fourth International Conference on Nanometer-scale Science and Technology, 7-TuA8, Beijing, P.R.China, September (1996).
  216. Masahiro Yoshita, Takuji Takahashi, and Hiroyuki Sakaki:
    "STS Measurements Using Cleaved Semiconductor Tips",
    Fourth International Conference on Nanometer-scale Science and Technology, 11-TuP40, Beijing, P.R.China, September (1996).
  217. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Tunneling Characterization of GaAs and InAs by Scanning Tunneling Microscopy under Laser Irradiation",
    Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, 21-ThA10, Aspen, U.S.A., July (1995).
  218. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Laser-assisted STM Observation of GaAs/AlGaAs",
    Second International Colloquium on Scanning Tunneling Microscopy, Kanazawa, Japan, December (1994).

国内学会誌

  1. 才田 大輔,高橋 琢二,江面 知彦,筒井 謙,和田 恭雄:
    「磁気力顕微鏡を利用した電流誘起磁場測定における電流定量評価の可能性」
    日本応用磁気学会論文誌,30,233-236 (2006).
  2. 才田 大輔,高橋 琢二,江面 知彦,筒井 謙,和田 恭雄:
    「磁気力顕微鏡を利用した電流誘起磁場測定系の空間分解能の評価」
    日本応用磁気学会誌,29,306-309 (2005).
  3. 才田 大輔,高橋 琢二:
    「磁気力顕微鏡による電流路周囲の磁場勾配検出」
    日本応用磁気学会誌,28,417-420 (2004).
  4. 才田 大輔,高橋 琢二:
    「交流電流が作るGaAs/AlGaAsメサストライプ周辺磁界の磁気力顕微鏡観察」
    電子情報通信学会論文誌C,J86,204-205 (2003).
  5. 高橋 琢二,小野 志亜之:
    「KFMによるGaAs(110)面上InAs薄膜表面のポテンシャル計測」
    表面科学,22,309-314 (2001).
  6. 高橋 琢二:
    「自己形成InAsドットで覆われたGaAs表面の電子状態」
    表面科学,19,588-592 (1998).

国内学会・研究会

  1. 福澤亮太,高橋琢二:
    「二重バイアス変調方式静電引力顕微鏡による空乏層容量の周波数応答測定」
    第66回応用物理学会春季学術講演会,10a-W933-6, 東京 (2019).
  2. 福澤亮太,高橋琢二:
    「二重バイアス変調方式を用いたEFMによる\(\partial C/\partial V\)の周波数応答測」
    第79回応用物理学会秋季学術講演会,18p-143-8, 愛知 (2018).
  3. 龍 顯得, 峯元高志,高橋琢二:
    「P-KFMによるCIGS太陽電池の光起電力及びその減衰特性の観測」
    2017年 第64回応用物理学会春季学術講演会,16a-F201-3,神奈川 (2017).
  4. 龍 顯得, 峯元高志,高橋琢二:
    「P-KFMによるCIGS太陽電池の光起電力測定と照射光波長依存性」
    2016年 第77回応用物理学会秋季学術講演会,13p-B9-5,新潟 (2016).
  5. 小松里紗,峯元高志, 高橋琢二:
    「光熱モードAFMを用いたCIGS単膜およびCdS/CIGS膜における非発光再結合特性の評価」
    2016年 第63回 応用物理学会春季学術講演会,21p-S221-5,東京 (2016).
  6. 高橋琢二:
    「SPM で表面から『内部』を探る ~ 光援用SPM を利用した太陽電池材料や量子ナノ構造の物性評価を例にして 」
    H27年度KAST教育講座「走査型プローブ顕微鏡の最新活用術~今こそ使い時、もうひとつのナノテク基盤技術~」,神奈川 (2016).[依頼講演]
  7. 高橋琢二:
    「光援用SPMによる微結晶太陽電池材料中の光励起キャリアダイナミクスの解明」
    「ナノ量子情報エレクトロニクス連携研究拠点」 成果シンポジウム,東京 (2015).
  8. 高橋琢二:
    「SPM で表面から『内部』を探る ~ 光援用SPM を利用した太陽電池材料や量子ナノ構造の物性評価を例にして 」
    H26年度KAST教育講座「走査型プローブ顕微鏡の最新活用術~今こそ使い時、もうひとつのナノテク基盤技術~」,神奈川 (2015).[依頼講演]
  9. 石井智章, 峯元高志, 高橋琢二:
    「静電引力顕微鏡によるCdS/CIGS界面空乏層容量の評価」
    2015年 第76回 応用物理学会秋季学術講演会,14p-2M-12,愛知 (2015).
  10. 高橋琢二:
    「Photo-assisted Scanning Probe Microscopy on Solar Cells」
    2015年度 第1回AIMRジョイントセミナー, 宮城, 4月(2015).[依頼講演]
  11. 石井智章, 峯元高志, 高橋琢二:
    「CIGS上でのケルビンプローブフォース顕微鏡及び静電引力顕微鏡による表面電位分布と静電引力スペクトルの観測 」
    2015年 第62回応用物理学会春季学術講演会,13a-A17-12,神奈川 (2015).
  12. 高橋琢二:
    「SPMで表面から「内部」を探る ~光援用SPMを利用した太陽電池材料や量子ナノ構造の物性評価を例にして~」
    H25年度KAST教育講座「走査型プローブ顕微鏡の最新活用術」,神奈川 (2014).[依頼講演]
  13. 龍 顯得, 峯元高志,高橋琢二:
    「Ga組成の異なるCIGS太陽電池上でのP-KFMによる光励起キャリア再結合プロセスの評価」
    2014年 第75回応用物理学会秋季学術講演会,19a-A28-5,北海道 (2014).
  14. 石井智章, 峯元高志, 高橋琢二:
    「ケルビンプローブフォース顕微鏡によるCIGS太陽電池の表面電位および容量の評価」
    2014年 第75回応用物理学会秋季学術講演会,19a-A28-4,北海道 (2014).
  15. 高橋琢二:
    「光援用ナノプローブによる太陽電池材料の局所的評価」
    千葉工業大学,千葉 (2014).[依頼講演]
  16. 高橋琢二:
    「ナノの目で見る太陽電池材料」
    駒場リサーチキャンパス公開講演会・シンポジウム,東京 (2014).[依頼講演]
  17. 龍 顯得, 峯元高志,高橋琢二:
    「光照射KFMによるCIGS太陽電池における光励起キャリア再結合プロセスの評価」
    ナノ量子情報エレクトロニクス研究機構シンポジウム,東京 (2014).
  18. 石井智章, 峯元高志, 高橋琢二:
    「ケルビンプローブフォース顕微鏡によるCIGS太陽電池の物性評価」
    ナノ量子情報エレクトロニクス研究機構シンポジウム,東京 (2014).
  19. 高橋琢二:
    「光援用ナノプローブによる太陽電池材料評価」
    ナノ量子情報エレクトロニクス研究機構シンポジウム,MO-13,東京 (2014).[招待講演]
  20. 高橋琢二:
    「光援用ナノプローブによる太陽電池材料評価」
    第1回奨励会特別研究委員会「生研最新トピック」,東京 (2014).[依頼講演]
  21. 石井智章, 峯元高志,高橋琢二:
    「ケルビンプローブフォース顕微鏡によるCIGS太陽電池の物性評価」
    光電子融合研究センター公開シンポジウム ~光電子融合の展望~,東京 (2014).
  22. 龍 顯得, 峯元高志,高橋琢二:
    「光照射KFMによるCIGS太陽電池における光励起キャリア再結合プロセスの評価」
    光電子融合研究センター公開シンポジウム ~光電子融合の展望~,東京 (2014).
  23. 石井智章,峯元高志,高橋琢二:
    「ケルビンプローブフォース顕微鏡によるCIGS太陽電池の暗状態及び光照射下での表面電位評価」
    2014年 第61回応用物理学会春季学術講演会,19a-D7-5,神奈川 (2014).
  24. 龍 顯得,中島 悠,峯元高志,高橋琢二:
    「P-KFMによるCIGS太陽電池における光励起キャリア再結合プロセスの評価」
    2013年 第60回応用物理学会春季学術講演会,28p-G4-6,神奈川 (2013).
  25. 浜本 寧,原 賢二,峯元高志,高橋琢二:
    「AFM光熱分光法によるCu(In,Ga)Se2太陽電池における非発光再結合の観測」
    2013年 第60回応用物理学会春季学術講演会,28p-G4-7,神奈川 (2013).
  26. 才田大輔,大沢裕一,伊藤順一,高橋琢二:
    「IBE加工状態の真空一貫KFM観察」
    2013年 第60回応用物理学会春季学術講演会,28a-PA2-7,神奈川 (2013).
  27. 高橋琢二:
    「SPMを用いた太陽電池材料の多角的評価 」
    (招待講演) 第17回結晶工学セミナー「物理・化学分析の最先端技術を基礎から理解する」
    -グリーンデバイス材料を中心に-,東京 (2012).
  28. 龍 顯得,中島 悠,峯元高志,高橋琢二:
    「P-KFMによるCIGS太陽電池における 再結合プロセスの時定数測定」
    2012年 秋季 第73回 応用物理学会学術講演会,11p-H8-2, 松山 (2012).
  29. 浜本 寧,原 賢二,峯元 高志,高橋琢二:
    「AFM光熱分光法によるCu(In,Ga)Se2薄膜中ギャップ内準位の観測」
    2012年 秋季 第73回 応用物理学会学術講演会,12p-H8-15, 松山 (2012).
  30. 勝井秀一,高橋琢二:
    「二波長光照射STMにて観測したInAs準量子井戸の光誘起電流信号スペクトルの井戸幅依存性」
    2012年春季第59回応用物理学会関係連合講演会,15a-F5-5,東京 (2012).
  31. 原 賢二,峯元高志,高橋琢二:
    「Cu(InGa)Se2薄膜に対するAFM光熱分光測定」
    2012年春季第59回応用物理学会関係連合講演会,17p-C1-7,東京 (2012).
  32. 原 賢二,高橋琢二:
    「多結晶Si太陽電池に対する近赤外光照射下でのAFM光熱分光測定」
    2012年春季第59回応用物理学会関係連合講演会,17p-B10-16,東京 (2012).
  33. 中島 悠,峯元高志,高橋琢二:
    「CIGS太陽電池における光起電力減衰時定数と再結合プロセス」
    2012年春季第59回応用物理学会関係連合講演会,17p-C1-10,東京 (2012).
  34. 高橋琢二:
    「SPMを利用した太陽電池材料の評価」
    (招待講演) 第21回格子欠陥フォーラム「格子欠陥が担うエネルギー・環境材料に関する挑戦課題」
    ,富山 (2011).
  35. 原 賢二,高橋琢二:
    「走査プローブ顕微鏡を用いた光熱/ポテンシャル測定による多結晶シリコン太陽電池の局所的評価」
    2011年秋季第72回応用物理学会学術講演会,1p-ZH-9,山形 (2011).
  36. 中島 悠,峯元高志,高橋琢二:
    「CIGS太陽電池における光起電力減衰時定数測定」
    2011年秋季第72回応用物理学会学術講演会,30p-H-9,山形 (2011).
  37. 勝井秀一,高橋琢二:
    「InAs 細線上での二波長光照射STM による光誘起電流信号スペクトルに関する検討」
    2011年秋季第72回応用物理学会学術講演会,30a-ZC-6,山形 (2011).
  38. 田辺 翔,阿登正幸,沖川侑揮,水谷 孝,高橋琢二:
    「MFMによるCNT-FET個別チャネルの評価と静電引力の影響の考察」
    第58回春季応用物理学会,27a-BR-7,神奈川 (2011).
  39. 田辺 翔,阿登正幸,沖川侑揮,水谷 孝,高橋琢二:
    「磁気力顕微鏡を用いたCNT-FET 中個別チャネルの電気的特性評価」
    ナノ量子情報エレクトロニクス研究機構 公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
    ,P-53,東京 (2010).
  40. 山田俊介,高橋琢二:
    「導電性探針AFM によるInAs 量子ドット上での静電引力スペクトルの観測」
    ナノ量子情報エレクトロニクス研究機構 公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
    ,P-52,東京 (2010).
  41. 原 賢二,高橋琢二:
    「原子間力顕微鏡による多結晶Si 太陽電池の局所的光熱解析」
    ナノ量子情報エレクトロニクス研究機構 公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
    ,P-49,東京 (2010).
  42. 瀧原昌輝,峯元高志,高橋琢二:
    「走査プローブ顕微鏡を利用したCu(InGa)Se2 太陽電池材料中結晶粒界近傍のバンド構造解析」
    ナノ量子情報エレクトロニクス研究機構 公開シンポジウム「ナノ量子情報エレクトロニクスの進展」
    ,P-6,東京 (2010).
  43. 高橋琢二:
    「磁気力顕微鏡による電流誘起磁場計測とCNT-FET個別チャネル特性解析への応用」
    (依頼講演) 日本学術振興会ナノプローブテクノロジー第167委員会 第60回研究会「半導体評価技術におけるSPMの新展開を探る」
    東京 (2010).
  44. 田辺 翔,阿登正幸,沖川侑揮,水谷 孝,高橋琢二:
    「SPMによるCNT-FET個別チャネルの評価」
    第71回応用物理学会学術講演会,17a-P12-5,長崎 (2010).
  45. 勝井秀一,高橋琢二:
    「光照射STMによるInAs細線の光吸収偏光依存性の観測」
    第71回応用物理学会学術講演会,16a-P9-10,長崎 (2010).
  46. 原 賢二,高橋琢二:
    「原子間力顕微鏡を用いた光熱分光測定による結晶系シリコン太陽電池材料の評価」
    第71回応用物理学会学術講演会,15p-ZB-11,長崎 (2010).
  47. 高橋琢二,瀧原昌輝,峯元高志:
    「光KFMによるCIGS太陽電池の表面電位および光起電力のマッピング測定」
    (依頼講演) 第57回春季応用物理学会,17p-TF-6,平塚 (2010).
  48. 原 賢二,高橋琢二:
    「局所的光熱分光測定による多結晶シリコン材料の評価」
    第57回春季応用物理学会,18p-TG-4,平塚 (2010).
  49. 瀧原昌輝,高橋琢二,脇坂暢一,峯元高志:
    「CIGS太陽電池の結晶粒界近傍におけるバンドプロファイリング」
    第57回春季応用物理学会,18p-TK-17,平塚 (2010).
  50. 勝井秀一,高橋琢二:
    「二波長光照射STMによるInAs細線の評価」
    第57回春季応用物理学会,20a-TR-5,平塚 (2010).
  51. 山田俊介,高橋琢二:
    「GaAs上自己形成InAs量子ドットにおける静電気力スペクトルの観測 -II-」
    第57回春季応用物理学会,20a-TR-4,平塚 (2010).
  52. 原 賢二,高橋琢二:
    「多結晶シリコン太陽電池に対する局所的光熱分光測定」
    第70回応用物理学会学術講演会,10p-ZA-10,富山 (2009).
  53. 瀧原昌輝,峯元高志,脇坂暢一,高橋琢二:
    「CIGS太陽電池の結晶粒界におけるポテンシャル分布とそのGa濃度依存性」
    第70回応用物理学会学術講演会,11p-TC-8,富山 (2009).
  54. 山田俊介,高橋琢二:
    「GaAs上自己形成InAs量子ドットにおける静電気力スペクトルの観測」
    第70回応用物理学会学術講演会,9p-L-13,富山 (2009).
  55. 勝井秀一,高橋琢二:
    「二波長光照射STMによる光誘起電流信号のフォトンエネルギ依存性」
    第70回応用物理学会学術講演会,9p-L-6,富山 (2009).
  56. 阿登正幸,沖川侑揮,水谷孝,高橋琢二:
    「磁気力顕微鏡によるマルチチャネル型CNT-FETの電気伝導特性評価」
    第56回春季応用物理学会,1p-TA-7,つくば (2009).
  57. 瀧原昌輝,峯元高志,脇坂暢一,山田賢史,高橋琢二:
    「CIS系太陽電池の結晶粒界近傍での光KFMによる光起電力評価」
    第56回春季応用物理学会,2a-P18-16,つくば (2009).
  58. 高橋琢二,瀧原昌輝:
    「光KFMによる多結晶シリコン太陽電池の局所的物性評価」
    (依頼講演) 第56回春季応用物理学会,31p-TG-6,つくば (2009).
  59. 原 賢二,高橋琢二:
    「二重サンプリングAFMによるGaAs/AlGaAs量子井戸(110)へき開面の光熱分光測定」
    第56回春季応用物理学会,30a-TE-4,つくば (2009).
  60. 勝井秀一,高橋 琢二:
    「2波長光照射STMによるInAs細線上での光誘起電流信号の観測とその起源の検討」
    第56回春季応用物理学会,30a-TE-3,つくば (2009).
  61. 原 賢二,高橋琢二:
    「ピエゾ抵抗カンチレバーを用いたAFMによる光熱分光測定」
    第69回応用物理学会学術講演会,5a-L-5,名古屋 (2008).
  62. 勝井秀一,高橋琢二:
    「2波長励起による光照射STMを用いたInAs細線上での光誘起電流信号観測」
    第69回応用物理学会学術講演会,5a-L-4,名古屋 (2008).
  63. 阿登正幸,高橋琢二:
    「FIB加工によるねじれ変位強調型カンチレバーの作製」
    第69回応用物理学会学術講演会,4p-L-7,名古屋 (2008).
  64. 瀧原昌輝,高橋琢二:
    「光KFM による少数キャリアライフタイム測定の妥当性の検証」
    第69回応用物理学会学術講演会,3a-S-6,名古屋 (2008).
  65. 高橋琢二:
    「光照射KFM(ケルビンプローブフォース顕微鏡)を利用した多結晶シリコン太陽電池中の少数キャリアダイナミクスの解明」
    (依頼講演) SII 走査型プローブ顕微鏡セミナー2008,東京 (2008).
  66. 勝井秀一,高橋琢二:
    「光照射STM によるInAs 細線上での光応答信号の観測」
    第55回応用物理学関係連合講演会,28a-Q-8,千葉 (2008).
  67. 松本忠久,小野志亜之,高橋琢二:
    「間欠バイアスKFM を利用した静電引力の距離依存性に関する検討」
    第55回応用物理学関係連合講演会,29a-Q-12,千葉 (2008).
  68. 瀧原昌輝,宇治原 徹,高橋琢二:
    「光KFM による多結晶Si 太陽電池の少数キャリアライフタイム測定」
    第55回応用物理学関係連合講演会,30a-ZC-2,千葉 (2008).
  69. 瀧原昌輝,宇治原 徹,高橋琢二:
    「光KFM による多結晶Si 太陽電池の少数キャリア拡散長及び移動度測定」
    第55回応用物理学関係連合講演会,30a-ZC-3,千葉 (2008).
  70. 瀧原昌輝,五十嵐考俊,宇治原 徹,高橋琢二:
    「ケルビンプローブフォース顕微鏡による多結晶シリコン太陽電池の局所的光起電力評価」
    第54回応用物理学関係連合講演会,27a-ZK-8,神奈川 (2007).
  71. 瀧原昌輝,宇治原 徹,高橋琢二:
    「ケルビンプローブフォース顕微鏡による多結晶シリコン太陽電池の少数キャリア拡散長測定」
    第54回応用物理学関係連合講演会,27a-ZK-9,神奈川 (2007).
  72. 瀧原昌輝,五十嵐考俊,宇治原 徹,高橋琢二:
    「自己検知型カンチレバーを用いたKFMによる多結晶シリコン太陽電池の局所的光起電力評価」
    第67回応用物理学会学術講演会,30a-Y-9,草津市 (2006).
  73. 才田大輔,江面知彦,筒井 謙,和田恭雄,高橋琢二:
    「磁気力顕微鏡を用いた電流定量評価」
    第53回応用物理学関係連合講演会,24p-R-4,東京 (2006).
  74. 高橋琢二,五十嵐考俊,宇治原 徹:
    「AFM による多結晶シリコン太陽電池の光起電力評価」
    東北大学金属材料研究所ワークショップ,仙台 (2005).
  75. 才田大輔,江面知彦,筒井 謙,和田恭雄,高橋琢二:
    「磁気力顕微鏡を利用した電流誘起磁場測定系の定量性の評価」
    第29回日本応用磁気学会学術講演会,20pB- 2,つくば (2005).
  76. 高橋琢二:
    「走査プローブ顕微鏡を利用したナノ領域物性評価技術」
    (依頼講演) 日本顕微鏡学会第61回学鬱講演会,IIIG-06,つくば (2005).
  77. 五十嵐考俊,宇治原 徹,中嶋一雄,高橋琢二:
    「自己検知AFM プローブを用いた多結晶シリコン太陽電池の局所光起電力測定」
    第52回応用物理学関係連合講演会,29p-YH-15,さいたま (2005).
  78. 小野志亜之,高橋琢二:
    「カンチレバー励振に伴う静電引力変動を抑制したケルビンプローブフォース顕微鏡」
    第52回応用物理学関係連合講演会,30a-YQ-7,さいたま (2005).
  79. 才田大輔,江面知彦,筒井 謙,和田恭雄 ,高橋琢二:
    「MFMによる電流誘起磁場測定系における定量性に関する検討」
    第52回応用物理学関係連合講演会,30a-YQ-11,さいたま (2005).
  80. 池田 優,小野志亜之,高橋琢二:
    「ケルビンプローブフォース顕微鏡における新しい電位決定法の提案」
    第52回応用物理学関係連合講演会,31p-YQ-7,さいたま (2005).
  81. 高橋琢二:
    「ナノプローブを用いた微小領域物性評価技術の開発」
    第1回ナノテクノロジーセンター研究会,大阪 (2004).
  82. 高橋琢二,才田大輔:
    「磁気力顕微鏡(MFM)による微細電流路周囲磁場の観察」
    文部科学省ナノテクノロジー総合支援プロジェクト 極微細加工・造形支援グループワークショップ 2004,大阪 (2004).
  83. 才田大輔,高橋琢二:
    「磁気力顕微鏡を利用した電流誘起磁場測定系の空間分解能の評価」
    第28回日本応用磁気学会,23pE-15,沖縄 (2004).
  84. 才田大輔,高橋琢二:
    「磁気力顕微鏡を利用した電流誘起磁場測定系の空間分解能に関する検討」
    第65回秋季応用物理学会,3p-H-6,仙台 (2004).
  85. 小野志亜之,高橋琢二:
    「サンプル・ホールド回路を用いたNC-AFMベースのケルビンプローブフォース顕微鏡」
    第65回秋季応用物理学会,3p-H-8,仙台 (2004).
  86. 小野志亜之,高橋琢二:
    「サンプル・ホールド回路を用いたケルビンプローブフォース顕微鏡」
    第51回春季応用物理学会,30a-ZB-2,東京 (2004).
  87. 才田大輔,高橋琢二:
    「磁気力顕微鏡を利用した電流誘起磁場測定系の高感度化」
    第51回春季応用物理学会,30a-ZB-8,東京 (2004).
  88. 高橋琢二,小野志亜之:
    「サンプル・ホールド回路を利用したAFM 走査の高速化」
    第51回春季応用物理学会,30p-ZB-15,東京 (2004).
  89. 小野志亜之,高橋琢二:
    「KFM測定におけるポテンシャル分布の平均化の影響」
    第51回春季応用物理学会,31a-ZB-2,東京 (2004).
  90. 増田裕之,武内道一,高橋琢二:
    「導電性自己検知AFMプローブによるInAs細線の局所光電流スペクトロスコピー」
    第51回春季応用物理学会,31a-ZB-7,東京 (2004).
  91. 村中雅幸,高橋琢二:
    「二重変調バイアスを用いた新しいSTS測定」
    第51回春季応用物理学会,31a-ZB-5,東京 (2004).
  92. 才田大輔,高橋琢二:
    「交流電流が作るGaAs/AlGaAsメサストライプ周辺磁界の磁気力顕微鏡観察」
    電子情報通信学会2003年ソサイエティ大会,C-7-6,新潟 (2003).
  93. 才田大輔,高橋琢二:
    「磁気力顕微鏡による電流路周囲の磁場検出」
    第27回日本応用磁気学会学術講演会,19pC-11,大阪 (2003).
  94. 小野志亜之,高橋琢二:
    「KFM測定における静電引力の試料・探針間距離依存性」
    第64回秋季応用物理学会,31p-ZD-11,福岡 (2003).
  95. 増田裕之,武内道一,高橋琢二:
    「AFMを用いた局所光電流計測」
    第64回秋季応用物理学会,30a-D-9,福岡 (2003).
  96. 才田大輔,高橋琢二:
    「磁気力顕微鏡を利用したメサストライプ型電流路周辺磁場分布の検証」
    第64回秋季応用物理学会,30a-D-2,福岡 (2003).
  97. 小野志亜之,武内道一,高橋琢二:
    「KFMポテンシャル測定における探針・試料間距離の影響」
    第50回春季応用物理学会 (2003).
  98. 才田大輔,高橋琢二:
    「磁気力顕微鏡を利用した微小電流計測の感度向上」
    第50回春季応用物理学会,27p-C-10 (2003).
  99. 今田忠紘,小野志亜之,北村雅季,高橋琢二,荒川泰彦:
    「ケルビンプローブフォース顕微鏡による銅フタロシアニンFETの表面電位分布観察」
    第50回春季応用物理学会 (2003).
  100. 小野志亜之,武内道一,高橋琢二:
    「ケルビンプローブフォース顕微鏡を用いたInAs量子ドットのポテンシャル計測」
    第63回秋季応用物理学会,26p-P13-2 (2002).
  101. 才田大輔,高橋琢二:
    「磁気力顕微鏡による微小電流計測」
    第63回秋季応用物理学会,26a-ZQ-3 (2002).
  102. 小野 志亜之,武内 道一,高橋琢二:
    「導電性AFMによるInAs細線構造の電流およびポテンシャル測定」
    第62回秋季応用物理学会 (2001).
  103. 高田 幹,武内道一,高橋琢二:
    「InAs被覆(110)GaAs表面における光照射STM/STS計測」
    第62回秋季応用物理学会 (2001).
  104. 小野 志亜之,武内 道一,高橋琢二:
    「ケルビンプローブフォース顕微鏡を用いたGaAs(110)微傾斜基板上InAsナノ構造の表面電位測定」
    第61回秋季応用物理学会 (2000).
  105. 山本 洋,神谷 至,高橋琢二:
    「GaAs中に埋め込まれたInAs量子ドットの走査型容量顕微鏡観察」
    第47回春季応用物理学会 (2000).
  106. 山本 洋,高橋琢二:
    「微小交流電圧を重畳したSTM による容量計測」
    第11回日本MRS学術シンポジウム (1999).
  107. 屋鋪大輔,島田祐二,高橋琢二:
    「半導体埋め込み量子構造のSTM/STS 観測」
    第11回日本MRS学術シンポジウム (1999).
  108. 高橋琢二,野田武司,川向貴志,榊 裕之:
    「ケルビンプローブフォース顕微鏡によるGaAs上InAsの表面電位計測」
    第60回秋季応用物理学会 (1999).
  109. 山本 洋,高橋琢二:
    「微小交流電圧を重畳したSTMによるInAs被覆GaAs表面の変調電流測定」
    第60回秋季応用物理学会 (1999).
  110. 島田祐二,神谷 格,高橋琢二:
    「InAs量子ドットを埋め込んだGaAsにおけるSTM/STS」
    第60回秋季応用物理学会 (1999).
  111. 屋鋪大輔,高橋琢二:
    「STMによる表面近傍量子井戸中量子準位を介した共鳴トンネリングの観測」
    第60回秋季応用物理学会 (1999).
  112. 山本 洋,高橋琢二:
    「光照射STMによるGaAs p-n多層膜の断面観察」
    第46回春季応用物理学会 (1999).
  113. 川向貴志,高橋琢二:
    「導電性プローブAFMによる静電引力測定を通じた仕事関数の評価」
    第46回春季応用物理学会 (1999).
  114. 山本 洋,神谷 格,高橋琢二:
    「STMを用いたInAs被覆GaAs表面における光誘起効果の画像化」
    第59回秋季応用物理学会 (1998).
  115. 川向貴志,神谷 格,高橋琢二:
    「導電性プローブを有する接触型AFMでの静電引力測定 -InAs被覆GaAs表面電子状態の高分解能計測-」
    第59回秋季応用物理学会 (1998).
  116. 高橋琢二,神谷 格,榊 裕之:
    「InAs被覆GaAsのレーザ光照射下でのトンネルスペクトロスコピー」
    第58回秋季応用物理学会 (1997).
  117. 高橋琢二,吉田正裕:
    「光照射STMによる半導体極微細構造の評価」
    応用物理学会・応用電子物性分科会研究例会 (1996).
  118. 高橋琢二,吉田正裕:
    「レーザ光照射下でのGaAsのSTS測定」
    第43回春季応用物理学会 (1996).
  119. 吉田正裕,高橋琢二,榊 裕之:
    「半導体へき開tipを用いたSTS測定」
    第43回春季応用物理学会 (1996).
  120. 高橋琢二,吉田正裕,榊 裕之:
    「レーザ光照射STMにおけるGaAsのトンネル電流増大効果 -照射光波長依存性-」
    第56回秋季応用物理学会 (1995).
  121. 高橋琢二,吉田正裕,榊 裕之:
    「レーザ光照射STMによるGaAs,InAsのトンネル特性」
    第42回春季応用物理学会 (1995).
  122. 高橋琢二,吉田正裕,榊 裕之:
    「レーザ光照射STMによるGaAsのトンネルスペクトロスコピー」
    第55回秋季応用物理学会 (1994).