Takahashi Laboratory

Industrial Institute of Science,
The University of Tokyo

 

Nano-probing Technology

Nano-world through nano probe

∼ Watching what cannot be "seen" ∼

Scanning probe microscopy (SPM) including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), which has very high spatial resolution (about nano-scale), is used in various fields. We are aiming to develop SPM techniques in various environments (vacuum, strong magnetic field, low temperature) and make a way of developing novel nanodevices by local investigation of physical properties.

We welcome master and doctor course students

Takahashi laboratory belongs to the Institute of Industrial Science, and also belongs to the Department of Electrical Engineering and Information Systems (EEIS), Graduate School of Engineering. Information on the entrance examination can be found in the web site of EEIS. Since research topics in the university should be interdisciplinary, students with variety of backgrounds, not limited in the electrical engineering, are very welcome. If you have any questions or if you want to visit our laboratory, pleases ask Prof. Takahashi without hesitation.

What's new

2019.04.25: This page was renewed.

2019.04.04: Mr. Ishibasi joined us as M1 student.

Access

Address

Takahashi Laboratry,
Institute of Industrial Science, Universit of Tokyo 4-6-1, Meguro-ku Komaba, Tokyo, 153-8505, Japan

details

Location

Professor office:Ee-301

Laboratry :Ee-305

Telephone number

Ee-301:Professor office TEL +81-3-5452-6269
Ee-305:Laboratry TEL +81-3-5452-6270
FAX: +81-3-5452-6633