1.     Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sampling Method in Atomic Force Microscopy",
Proceedings of 38th IEEE Photovoltaic Specialists Conference (PVSC 38) (2012).

2.     Yu Nakajima, Masaki Takihara, Takashi Minemoto, and Takuji Takahashi:
"Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy",
Proceedings of 38th IEEE Photovoltaic Specialists Conference (PVSC 38) (2012).

3.     Kenji Hara and Takuji Takahashi:
"Photothermal Signal and Surface Potential around Grain Boundaries in Multicrystalline Silicon Solar Cells Investigated by Scanning Probe Microscopy",
Appl. Phys. Express, 5, 022301 (2012).

4.     Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"An Investigation of Band Profile around the Grain Boundary of Cu(InGa)Se2 Solar Cell Material by Scanning Probe Microscopy",
Prog. Photovolt: Res. Appl. [Published online: Nov. 16 (2011)].

5.     Takuji Takahashi:
"Photoassisted Kelvin Probe Force Microscopy on Multicrystalline Si Solar Cell Materials",
Jpn. J. Appl. Phys., 50, 08LA05 (2011).

6.     Shuichi Katsui and Takuji Takahashi:
"Photoabsorption Properties in InAs Wire Structures Investigated by Dual Light Illumination Method in Scanning Tunneling Microscopy",
Jpn. J. Appl. Phys., 50, 08LB08 (2011).

7.     Kenji Hara and Takuji Takahashi:
"Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material",
Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC), 1387-1389 (2010).

8.     Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Characterized by Scanning Probe Microscopy",
Proceedings of 35th IEEE Photovoltaic Specialists Conference (PVSC), 2512-2515 (2010).

9.     Masayuki Ato, Takuji Takahashi, Yuki Okigawa, and Takashi Mizutani:
"Conductance of Individual Channels in a Carbon Nanotube Field-effect Transistor Studied by Magnetic Force Microscopy",
J. Appl. Phys., 106, 114315 (2009).

10.  Masaki Takihara, Takuji Takahashi, and Toru Ujihara:
"Study of Minority Carrier Diffusion Length in Multicrystalline Silicon Solar Cells Using Photoassisted Kelvin Probe Force Microscopy",
Appl. Phys. Lett., 95, 191908 (2009).

11.  Shuichi Katsui and Takuji Takahashi:
"Dual Light Illumination Method in Scanning Tunneling Microscopy for Photoinduced Current Measurements on InAs Wires",
Jpn. J. Appl. Phys., 48, 08JB03 (2009).

12.  Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopic Measurements by Dual Sampling Method in Intermittent-Contact-Mode Atomic Force Microscopy",
Jpn. J. Appl. Phys., 48, 08JB22 (2009).

13.  Takuji Takahashi, Tadahisa Matsumoto, and Shiano Ono:
"Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection",
Ultramicroscopy 109, 963-967 (2009).

14.  Masaki Takihara, Takuji Takahashi, and Toru Ujihara:
"Minority Carrier Lifetime in Polycrystalline Silicon Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy",
Appl. Phys. Lett., 93, 021902 (2008).

15.  Masato Ohmori, Takuya Kawazu, Kousuke Torii, Takuji Takahashi, and Hiroyuki Sakaki:
"Formation of Ultra-low Density (104 cm-2) Self-Organized InAs Quantum Dots on GaAs by a Modified Molecular Beam Epitaxy Method",
Appl. Phys. Express, 1, 061202 (2008).

16.  Daisuke Saida, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Quantitative Current Evaluation Through Magnetic Field Detection by Magnetic Force Microscopy",
IEEE Trans. Magn., 44, 1779-1784 (2008).

17.  Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy with Piezoresistive Cantilever",
Jpn. J. Appl. Phys., 46, 5548-5551 (2007).

18.  Takuji Takahashi:
"Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials",
Proceedings on 6th Pacific Rim Conference on Ceramic and Glass Technology, 163 (2006).

19.  Shiano Ono and Takuji Takahashi:
"Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
Jpn. J. Appl. Phys., 45, 1931-1933 (2006).

20.  Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezo-resistive Cantilever",
Jpn. J. Appl. Phys., 45, 2128-2131 (2006).

21.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
Jpn. J. Appl. Phys., 44, 8625-8629 (2005).

22.  Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
"Local Photocurrent Detection on InAs Wires by Conductive AFM",
Ultramicroscopy, 105, 137-142 (2005).

23.  Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Atomic Force Microscopy for Fast Operation",
Ultramicroscopy, 105, 42-50 (2005).

24.  Shiano Ono and Takuji Takahashi:
"Sample-and-Hold Operation in Kelvin Probe Force Microscopy",
Jpn. J. Appl. Phys., 44, 6213-6217 (2005).

25.  Takuji Takahashi and Shiano Ono:
"Tip-to-sample Distance Dependence of an Electrostatic Force in KFM Measurements",
Ultramicroscopy, 100, 287-292 (2004).

26.  Takuji Takahashi and Daisuke Saida:
"Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy",
Ultramicroscopy, 100, 293-299 (2004).

27.  Masayuki Muranaka and Takuji Takahashi:
"Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
Jpn. J. Appl. Phys., 43, 4612-4614 (2004).

28.  Shiano Ono and Takuji Takahashi:
"Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy",
Jpn. J. Appl. Phys., 43, 4639-4642 (2004).

29.  Daisuke Saida and Takuji Takahashi:
"Magnetic Field Observation Around Current Path by Magnetic Force Microscopy",
Jpn. J. Appl. Phys., 43, 4643-4646 (2004).

30.  Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy",
Jpn. J. Appl. Phys., 43, L582-L584 (2004).

31.  Shiano Ono, Misaichi Takeuchi, Takeshi Noda, and Takuji Takahashi:
"Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Probe Force Microscopy",
Jpn. J. Appl. Phys., 42, 4869-4873 (2003).

32.  Daisuke Saida and Takuji Takahashi:
"Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
Jpn. J. Appl. Phys., 42, 4874-4877 (2003).

33.  Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
"Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
Ultramicroscopy, 97, 1-6 (2003).

34.  Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
"Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscope",
Jpn. J. Appl. Phys., 41, 4990-4993 (2002).

35.  Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Current and Potential Characterization on InAs Nanowires by Contact-mode Atomic Force Microscopy and Kelvin Probe Force Microscopy",
Ultramicroscopy, 91, 127-132 (2002).

36.  Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Kelvin Probe Force Microscopy on InAs Thin Films Grown on GaAs Giant Step Structures Formed on (110) GaAs Vicinal Substrates",
Appl. Phys. Lett., 78, 1086-1088 (2001).

37.  Hiroshi Yamamoto, Takuji Takahashi, and Itaru Kamiya:
"Local Capacitance Measurements on InAs dot-covered GaAs Surfaces by Scanning Capacitance Microscopy",
Appl. Phys. Lett., 77, 1994-1996 (2000).

38.  Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
"Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
Jpn. J. Appl. Phys., 39, 3721-3723 (2000).

39.  Takuji Takahashi and Takashi Kawamukai:
"Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
Ultramicroscopy, 82, 63-68 (2000).

40.  Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
"Electrostatic Force Characterization on InAs Dot-covered n-type (001) GaAs Surfaces by Contact-mode Atomic Force Microscopy with a Conductive Tip",
Appl. Phys. Lett., 75, 510-512 (1999).

41.  Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
"Characterization of InAs Dots on n-GaAs by AFM with a Conductive Tip",
Surface and Interface Analysis, 27, 547-549 (1999).

42.  Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
"Photoinduced Current Properties of InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
Jpn. J. Appl. Phys., 38, 3871-3874 (1999).

43.  Takuji Takahashi, Masahiro Yoshita, Itaru Kamiya, and Hiroyuki Sakaki:
"Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation",
Appl. Phys. A, 66, S1055-S1058 (1998).

44.  Takuji Takahashi and Masahiro Yoshita:
"Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation",
Appl. Phys. Lett., 70, 2162-2164 (1997).

45.  Masahiro Yoshita and Takuji Takahashi:
"Characterization of Cleaved GaAs Tips for Scanning Tunneling Microscopy",
Jpn. J. Appl. Phys., 36, 6957-6961 (1997).

46.  Masahiro Yoshita and Takuji Takahashi:
"Photoreflectance Spectra from a Surface and an Interface of n-type GaAs Epitaxial Layers and Their Modulation Frequency Dependence",
Appl. Surf. Sci., 115, 347-354 (1997).

47.  Takuji Takahashi and Masahiro Yoshita:
"Laser Irradiation Effects on Tunneling Properties of n-type GaAs and InAs by Scanning Tunneling Microscopy",
Appl. Phys. Lett., 68, 3479-3481 (1996).

48.  Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
"Scanning Tunneling Microscopy of Undoped GaAs/AlGaAs Heterostructures under Laser Irradiation",
Appl. Phys. Lett., 68, 502-504 (1996).

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Copyright 2011 Takahashi Lab., Institute of Industrial Science, University of Tokyo


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