1.     Hyeondeuk Yong, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
"Photovoltage Decay Measurements by P-KFM on Cu(In,Ga)Se2 Solar Cells",
20th International Colloquium on Scanning Probe Microscopy (ICSPM20), S10-1, Naha, Japan, December (2012).

2.     Yasushi Hamamoto, Kenji Hara, Takashi Minemoto, and Takuji Takahashi:
"Local Photothermal Measurements by AFM on Cu(In,Ga)Se2 Solar Cells",
20th International Colloquium on Scanning Probe Microscopy (ICSPM20), S3-67, Naha, Japan, December (2012).

3.     Takuji Takahashi:
"Photovoltage Decay Measurements by Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
4th Multifrequency AFM Conference, Oral 16, Madrid, Spain, October (2012).

4.     Kenji Hara and Takuji Takahashi:
"Local Photothermal Measurement by AFM around Grain Boundaries in Multicrystalline Si Solar Cell",
International Conference on Nanoscience + Technology (ICN+T2012), PO9.4, Paris, France, July (2012).

5.     Shuichi Katsui and Takuji Takahashi:
"Photoinduced Current Measurements on InAs Wires by Dual Light Illumination Method in STM",
International Conference on Nanoscience + Technology (ICN+T2012), SC-3.1, Paris, France, July (2012).

6.     Masaki Takihara, Kenji Hara, Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
"Scanning Probe Analyses on Cu(In,Ga)Se2 Solar Cell Materials",
Seeing at the Nanoscale 2012, Bristol, U.K., July (2012).

7.     Shuichi Katsui and Takuji Takahashi:
"Photo-Induced Current Spectra on InAs Wires Measured by Dual Light Illumination Method in STM",
The 14th International Scanning Probe Microscopy Conference (Toronto 2012), Toronto, Canada, June (2012).

8.     Takuji Takahashi, Yu Nakajima, Masaki Takihara, and Takashi Minemoto:
"Photo-assisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",(Invited)
The 14th International Scanning Probe Microscopy Conference (Toronto 2012), Toronto, Canada, June (2012).

9.     Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopy on Multicrystalline Silicon Solar Cell Materials by Dual Sampling Method in Atomic Force Microscopy",
38th IEEE Photovoltaic Specialists Conference (PVSC 38), 354, Austin, U.S.A., June (2012).

10.  Yu Nakajima, Masaki Takihara, Takashi Minemoto, and Takuji Takahashi:
"Photovoltage Decay Measurements on Cu(In,Ga)Se2 Solar Cells by Photo-assisted Kelvin Probe Force Microscopy",
38th IEEE Photovoltaic Specialists Conference (PVSC 38), 508, Austin, U.S.A., June (2012).

11.  Kenji Hara and Takuji Takahashi:
"Local Photothermal Measurement by AFM under Near-Infrared Light around Grain Boundaries in Multicrystalline Si Solar Cell",
19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S6-8, Toyako, Japan, December (2011).

12.  Yu Nakajima, Takashi Minemoto, and Takuji Takahashi:
"Photovoltage Decay Investigated by Photoassisted Kelvin Probe Force Microscopy on Cu(In,Ga)Se2 Solar Cells",
19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S6-1, Toyako, Japan, December (2011).

13.  Shuichi Katsui and Takuji Takahashi:
"Photoinduced Current Spectra on InAs Wires Observed by Dual Light Illumination Method in STM",
19th International Colloquium on Scanning Probe Microscopy (ICSPM19), S-4, Toyako, Japan, December (2011).

14.  Kenji Hara and Takuji Takahashi:
"Photothermal Signals on Multicrystalline Silicon Solar Cells Measured by Dual Sampling Method in Atomic Force Microscopy",
16th International Conference on Photoacoustic and Photothermal Phenomena (ICPPP16), IX.T.3(16724), Merida, Mexico, November (2011).

15.  Shuichi Katsui and Takuji Takahashi:
"Investigation of Photoabsorption Properties of Individual InAs Wire Structures through Scanning Tunneling Microscopy",
International Workshop on Quantum Nanostructures and Nanoelectronics (QNN2011), P-39, Tokyo, Japan, October (2011).

16.  Sho Tanabe, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
"Recognition of Current Routes in Multiple Channel CNT-FET by Scanning Probe Microscopies",
International Workshop on Quantum Nanostructures and Nanoelectronics (QNN2011), Tu-8, Tokyo, Japan, October (2011).

17.  Kenji Hara and Takuji Takahashi:
"Local Characterization of Multicrystalline Silicon Solar Cells through Photothermal and Potential Measurements by Scanning Probe Microscopy",
2011 International Conference on Solid State Devices and Materials (SSDM 2011), L-9-2, Nagoya, Japan, September (2011).

18.  Shuichi Katsui and Takuji Takahashi:
"Photoabsorption Properties in InAs Wires Characterized by Dual Light Illumination Method in Scanning Tunneling Microscopy",
Seeing at the Nanoscale 2011, P89, Santa Barbara, U.S.A., July (2011).

19.  Kenji Hara and Takuji Takahashi:
"Photothermal and Potential Measurements by SPM around Grain Boundaries in Multicrystalline Si Solar Cells",
Seeing at the Nanoscale 2011, P107, Santa Barbara, U.S.A., July (2011).

20.  Kenji Hara and Takuji Takahashi:
"Photothermal and Potential Properties Investigated by SPMs around Grain Boundary in Multicrystalline Si Solar Cell",
International Scanning Probe Microscopy Conference (ISPM 2011), P20, Munich, Germany, June (2011).

21.  Shuichi Katsui and Takuji Takahashi:
"Photoabsorption Properties in InAs Wire Structures Investigated by Scanning Tunneling Microscopy with Dual Light Illumination Method",
International Scanning Probe Microscopy Conference (ISPM 2011), P19, Munich, Germany, June (2011).

22.  Shou Tanabe, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
"Recognition of Current Routes in Multiple Channel CNT-FET by SPMs",
International Scanning Probe Microscopy Conference (ISPM 2011), Munich, Germany, June (2011).

23.  Kenji Hara and Takuji Takahashi:
"Local Photothermal Analysis around Grain Boundary in Multicrystalline Si Solar Cell by Atomic Force Microscopy",
International Workshop on Scanning Probe Microscopy for Energy Applications 2011, P20, Mainz, Germany, June (2011).

24.  Takuji Takahashi:
"Characterization of Solar Cell Materials by SPMs", (Invited)
International Workshop on Scanning Probe Microscopy for Energy Applications 2011, Mainz, Germany, June (2011).

25.  Takuji Takahashi, Masayuki Ato, Sho Tanabe, Yuki Okigawa, and Takashi Mizutani:
"Channel Properties in Carbon Nanotube Field-effect Transistors Investigated by Magnetic Force Microscopy",
IEEE International Magnetics Conference (INTERMAG 2011), ES-05, Taipei, Taiwan, April (2011).

26.  Shou Tanabe, Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
"Recognition of Current Route in Multi-channel CNT-FET by MFM",
18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S7-5, Atagawa, Japan, December (2010).

27.  Shuichi Katsui and Takuji Takahashi:
"Anisotropic Photoabsorption in InAs Wire Structures Studied by STM under Light Illumination",
18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S4-50, Atagawa, Japan, December (2010).

28.  Takuji Takahashi:
"SPM Characterization of Solar Cell Materials", (Invited)
18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), Atagawa, Japan, December (2010).

29.  Kenji Hara and Takuji Takahashi:
"Photothermal and Potential Properties around Grain Boundary in Multicrystalline Si Solar Cell Studied by AFM",
18th International Colloquium on Scanning Probe Microscopy (ICSPM 18), S4-47, Atagawa, Japan, December (2010).

30.  Takuji Takahashi:
"Nano-probe Characterization of Multicrystalline Si Solar Cell Materials", (Invited)
The Forum on the Science and Technology of Silicon Materials 2010, Okayama, Japan, November (2010).

31.  Kenji Hara and Takuji Takahashi:
"Local Photothermal Analysis by Atomic Force Microscopy around Grain Boundary in Multicrystalline Si Solar Cell",
The Forum on the Science and Technology of Silicon Materials 2010, P06, Okayama, Japan, November (2010).

32.  Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopy by Atomic Force Microscopy on Crystalline Silicon Solar Cell Materials",
2010 International Conference on Solid State Devices and Materials (SSDM 2010), I-8-6, Tokyo, Japan, September (2010).

33.  Shuichi Katsui and Takuji Takahashi:
"Dependence of Photoabsorption Property on Incident Light Polarization Investigated by STM on InAs Wire Structures",
18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), NST6-O-3, Beijing, P.R.China, August (2010).

34.  Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopic Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material",
18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), ASS/SS6-O-3, Beijing, P.R.China, August (2010).

35.  Takuji Takahashi, Masaki Takihara, Takashi Minemoto, and Youichi Wakisaka:
"Scanning Probe Microscopy on Cu(InGa)Se2 Solar Cell Material to Analyze Band Profile around Grain Boundary",
18th International Vacuum Congress (IVC-18) / International Conference on Nanoscience and Technology (ICN+T 2010), ASS/SS4-O-4, Beijing, P.R.China, August (2010).

36.  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Characterized by Scanning Prove Microscopy",
35th IEEE Photovoltaic Specialists Conference (PVSC), 622-F1, Honolulu, U.S.A., June (2010).

37.  Kenji Hara and Takuji Takahashi:
"Photothermal Characterization by Atomic Force Microscopy around Grain Boundary in Multicrystalline Silicon Material",
35th IEEE Photovoltaic Specialists Conference (PVSC), 317-K7, Honolulu, U.S.A., June (2010).

38.  Shunsuke Yamada and Takuji Takahashi:
"Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by AFM with a Conductive Tip",
The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-33, Sapporo, Japan, May (2010).

39.  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Band Profile around Grain Boundary of Cu(InGa)Se2 Solar Cell Materials Investigated by Scanning Probe Microscopy",
The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-26, Sapporo, Japan, May (2010).

40.  Shuichi Katsui and Takuji Takahashi:
"Photoinduced Current Signal Excited by Linearly Polarized Light Studied by STM on InAs Wire Structures", 
The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), MoP-25, Sapporo, Japan, May (2010).

41.  Kenji Hara and Takuji Takahashi:
"Local Photothermal Measurements by AFM around Grain Boundary in Multicrystalline Silicon Material",
The 12th International Scanning Probe Microscopy Conference (Sapporo 2010), TuE-3, Sapporo, Japan, May (2010).

42.  Kenji Hara and Takuji Takahashi:
"Nonradiative Recombination Property around Grain Boundary in Multicrystalline Silicon Materials Studied by Photothermal Measurements in AFM",
17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S8-3, Atagawa, Japan, December (2009).

43.  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Grain Boundary Characteristics of Cu(InGa)Se2 Solar Cells Studied by Photoassisted Kelvin Probe Force Microscopy",
17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S8-2, Atagawa, Japan, December (2009).

44.  Shuichi Katsui and Takuji Takahashi:
"Photon Energy Dependence of Photoinduced Current Signal Studied by Dual Light Illumination Method in STM",
17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S4-53, Atagawa, Japan, December (2009).

45.  Shunsuke Yamada and Takuji Takahashi:
"Electrostatic Force Spectra on InAs Quantum Dots on GaAs Obtained by Noncontact AFM with a Conductive Tip",
17th International Colloquium on Scanning Probe Microscopy (ICSPM 17), S4-43, Atagawa, Japan, December (2009).

46.  Kenji Hara and Takuji Takahashi:
"Local Measurements of Photothermal Signals on Polycrystalline Silicon Materials by Dual Sampling Method in Atomic Force Microscopy",
2009 International Conference on Solid State Devices and Materials (SSDM 2009), K-5-5L, Sendai, Japan, October (2009).

47.  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Potential Profiles around Grain Boundary Studied by Photoassisted Kelvin Probe Force Microscopy on Cu(InGa)Se2 Solar Cells",
2009 International Conference on Solid State Devices and Materials (SSDM 2009), H-9-2, Sendai, Japan, October (2009).

48.  Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
"Channel Property of Individual Carbon Nanotubes in a Field Effect Transistor Characterized by Magnetic Force Microscopy",
International Conference on Carbon Nanostructured Materials (Cnano'09), O-10, Athen, Greece, October (2009).

49.  Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
"Electrical Properties of Individual Carbon Nanotube Channels in a Field Effect Transistor Studied by Magnetic Force Microscopy",
The International Symposium on Carbon Nanotube Nanoelectronics (CNTNE 2009), 2P-20, Matsushima, Japan, June (2009).

50.  Takuji Takahashi and Kenji Hara:
"Photothermal Spectroscopy by Atomic Force Microscopy with Dual Sampling Method",
XI International Scanning Probe Microscopy Conference (ISPM 2009), Ins8, Madrid, Spain, June (2009).

51.  Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
"Characterization of Individual Carbon Nanotube Channels in a Field-effect Transistor by Means of Magnetic Force Microscopy",
XI International Scanning Probe Microscopy Conference (ISPM 2009), Oral 35, Madrid, Spain, June (2009).

52.  Masaki Takihara, Takashi Minemoto, Youichi Wakisaka, and Takuji Takahashi:
"Photovoltaic Characterization of Cu(InGa)Se2 and Cu(InAl)Se2 Solar Cells by Photoassisted Kelvin Probe Force Microscopy",
The 34th IEEE Photovoltaic Specialists Conference (PVSC 34), Philadelphia, U.S.A., June (2009).

53.  Takuji Takahashi, Masayuki Ato, Yuki Okigawa, and Takashi Mizutani:
"Individual Channel Conductance in a Carbon Nanotube Field-effect Transistor Studied by Magnetic Force Microscopy",
The International Magnetics Conference, (INTERMAG 2009), AB-04, Sacramento, U.S.A., May (2009).

54.  Masaki Takihara and Takuji Takahashi:
"Photoassisted Kelvin Probe Force Microscopy for Measuring Minority Carrier Lifetime in Solar Cell Materials",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-26, Atagawa, Japan, (2008).

55.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Multiple Characterization of Minority Carriers in Polycrystalline Silicon Solar Cells by Photoassisted Kelvin Probe Force Microscopy",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-25, Atagawa, Japan, December (2008).

56.  Kenji Hara and Takuji Takahashi:
"Photothermal Spectroscopic Measurements by Dual Sampling Method in Atomic Force Microscopy",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-19, Atagawa, Japan, December (2008).

57.  Masayuki Ato and Takuji Takahashi:
"FIB-processed Cantilever for Lowering Torsional Spring Constant",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S4-5, Atagawa, Japan, December (2008).

58.  Shuichi Katsui and Takuji Takahashi:
"Dual Light Illumination Method in STM for Photo-induced Current Measurements on InAs Wires",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S8-4, Atagawa, Japan, December (2008).

59.  Masayuki Ato, Yuki Okigawa, Takashi Mizutani, and Takuji Takahashi:
"Electrical Characterization by Magnetic Force Microscopy on Individual Channels in a Carbon Nanotube Field-Effect Transistor",
16th International Colloquium on Scanning Probe Microscopy (ICSPM 16), S5-2, Atagawa, Japan, December (2008).

60.  Takuji Takahashi, Tadahisa Matsumoto, Daisuke Saida, and Shiano Ono:
"Nano-probing Techniques for Electrical and Optical Characterization of Nanostructures",
UC Santa Barbara - University of Tokyo Workshop, P-21, Santa Barbara, U.S.A., September (2008).

61.  Shuichi Katsui and Takuji Takahashi:
"Photo-induced Signals on InAs Wires by STM under Light Illumination",
UC Santa Barbara - University of Tokyo Workshop, P-31, Santa Barbara, USA, September (2008).

62.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy",
UC Santa Barbara - University of Tokyo Workshop, P-41, Santa Barbara, U.S.A., September (2008).

63.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Investigated by Photo-assisted Kelvin Probe Force Microscopy",
18th Workshop on Crystalline Silicon Solar Cells Modules: Materials and Processes, #1, Vail, U.S.A., August (2008).

64.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Photo-assisted Kelvin Probe Force Microscopy for Investigating Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells",
International Conference on Nanoscience+Technology (ICN+T 2008), SP-TuM11, Keystone, U.S.A., July (2008).

65.  Takuji Takahashi, T. Matsumoto, and Shiano Ono:
"Intermittent Bias Application Method for High Performance KFM",
International Conference on Nanoscience+Technology (ICN+T 2008), SP-TuM12, Keystone, USA, July (2008).

66.  Takuji Takahashi and Shuichi Katsui:
"Photo-induced Signals on InAs Wires Studied by STM under Light Illumination",
International Scanning Probe Microscopy Conference (Seattle 08), P-55, Seattle, U.S.A., June (2008).

67.  Takuji Takahashi, T. Matsumoto, and Shiano Ono:
"Improvement of KFM Performance by Intermittent Bias Application Method and by Sampling Detection of Cantilever Deflection",
International Scanning Probe Microscopy Conference (Seattle 08), P-18, Seattle, U.S.A., June (2008).

68.  Takuji Takahashi, M. Takihara, and Toru Ujihara:
"Minority Carrier Dynamics in Polycrystalline Silicon Solar Cell Investigated by Photo-assisted Kelvin Probe Force Microscopy",
International Scanning Probe Microscopy Conference (Seattle 08), O-7, Seattle, U.S.A., June (2008).

69.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi: 
"Diffusion Length, Lifetime and Mobility of Minority Carrier in Polycrystalline Silicon Solar Cells Measured by Photo-assisted Kelvin Probe Force Microscopy", 
The 4th Asian Conference on Crystal Growth and Crystal Technology (CGCT4), #437, Sendai, Japan, May (2008).

70.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy", 
33rd IEEE Photovoltaic Specialists Conference (PVSC 33), #581, San Diego, U.S.A., May (2008).

71.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi: 
"Minority Carrier Dynamics in Polycrystalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy", 
15th International Colloquium on Scanning Probe Microscopy (ICSPM 15), S10-5, Atagawa, Japan, December (2007)

72.  Tadahisa Matsumoto, Shiano Ono, and Takuji Takahashi:
"Influence of a Long-range Feature of an Electrostatic Force and Effectiveness of Intermittent Bias Application Method in Kelvin Probe Force Microscopy", 
15th International Colloquium on Scanning Probe Microscopy (ICSPM 15), S4-79, Atagawa, Japan, December (2007).

73.  Shuichi Katsui and Takuji Takahashi: 
"Photo-induced Signals on InAs Wires Studied by UHV-STM", 
15th International Colloquium on Scanning Probe Microscopy (ICSPM15), S4-91, Atagawa, Japan, December (2007).

74.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi: 
"Minority Carrier Dynamics in Polycristalline Silicon Solar Cells Studied by Photo-assisted Kelvin Probe Force Microscopy", 
17th International Photovoltaic Science and Engineering Conference (PVSEC-17), 4P-P2-53, Fukuoka, Japan, December (2007).

75.  Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi: 
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy", 
22nd European Photovoltaic Solar Energy Conference (22nd EU-PVSEC), 1CV.2.12, Milano, Italy, September (2007).

76.  Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi: 
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Micorscopy", 
17th International Vacuum Congress (IVC-17) / 13th International Conference on Surface Science (ICSS-13) / International Conference on Nano Science and Technology (ICN+T 2007), NSP1-84, Stockholm, Sweden, July (2007).

77.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi:
"Minority Carrier Diffusion Length Measurements on Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy", 
17th International Vacuum Congress (IVC-17) / 13th International Conference on Surface Science (ICSS-13) / International Conference on Nano Science and Technology (ICN+T 2007), NSP1-86, Stockholm, Sweden, July (2007).

78.  Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara: 
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells Studied by Kelvin Probe Force Microscopy",
International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), OP3, Jeju, Korea, June (2007).

79.  Takuji Takahashi, Masaki Takihara, and Toru Ujihara: 
"Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cell Materials Evaluated through Surface Photovoltage Measurements by KelvinProbeForceMicroscopy", 
International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), PI-1-07, Jeju, Korea, June (2007).

80.  Takuji Takahashi: 
"Electrostatic Force Spectroscopy on Self-assembled InAs Quantum Dots", 
International Scanning Probe Microscopy Conference (Jeju 2007 ISPM), PII-4-06, Jeju, Korea, June (2007).

81.  Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara: 
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever", 
Nano and Giga Challenges in Electronics and Photonics (NGC 2007), P64, Phoenix, U.S.A., March (2007).

82.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi: 
"Quantitative Current Evaluation around Artificial Current Networks by Magnetic Force Microscopy", 
Nano and Giga Challenges in Electronics and Photonics (NGC 2007), P65, Phoenix, U.S.A., March (2007).

83.  Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi: 
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever", 
14th International Colloquium on Scanning Probe Microscopy (ICSPM 14), S10-3, Atagawa, Japan, December (2006).

84.  Masaki Takihara, Toru Ujihara, and Takuji Takahashi: 
"Local Measurements of Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy", 
14th International Colloquium on Scanning Probe Microscopy (ICSPM 14), S4-35p, Atagawa, Japan, December (2006).

85.  Masaki Takihara, Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi: 
"Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever", 
International Conference on Solid State Devices and Materials (SSDM2006), P-9-9, Yokohama, Japan, September (2006).

86.  Takuji Takahashi, Daisuke Saida, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada: 
"Magnetic Force Microscopy around Artificial Current Networks for Quantitative Evaluation of Current", 
International Conference on Nanoscience and Technology (ICN+T 2006), P689, Basel, Switzerland, August (2006).

87.  Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara: 
"Local Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever", 
International Conference on Nanoscience and Technology (ICN+T 2006), P634, Basel, Switzerland, August (2006).

88.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi: 
"Quantitative Current Evaluation through Magnetic Field Detection by Magnetic Force Microscopy", 
Asia-Pacific Symposium on Applied Electromagnetics and Mechanics, B2-2, Sydney, Australia, July (2006).

89.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi: 
"Quantitative Evaluation of Current by Magnetic Force Microscopy", 
Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier 2006), Montpellier, France, June (2006) [Invited].

90.  Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi, and Toru Ujihara: 
"Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever", 
Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier 2006), SPM-16, Montpellier, France, June (2006).

91.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi: 
"Quantitative Evaluation of Current through Magnetic Field Observation by Magnetic Force Microscopy", 
International Magnetics Conference (INTERMAG 2006), HD-06, San Diego, U.S.A., May (2006).

92.  Takuji Takahashi, Shiano Ono, Daisuke Saida, and Takatoshi Igarashi:
"Nano-probing Techniques for Electrical and Optical Characterization of Nanostructures",
International Symposium on Advanced Electronics for Future Generations, 1.6, Tokyo, Japan, October (2005).

93.  Takuji Takahashi:
"Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials" (Invited),
6th Pacific Rim Conference on Ceramic and Glass Technology (PacRim 6), PACRIM-EL2-6-2005, Maui, U.S.A., September (2005).

94.  Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
"Quantitativeness in Current Evaluation through Current-induced Magnetic Field Detection by Magnetic Force Microscopy",
The 23rd European Conference on Surface Science (ECOSS 23), Appl22, Berlin, Germany, September (2005).

95.  Shiano Ono and Takuji Takahashi:
"Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Mon-5-C4, Sapporo, Japan, July (2005).

96.  Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
"A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Mon-Pos-67, Sapporo, Japan, July (2005).

97.  Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Ability in Quantitative Measurement of Current-Induced Magnetic Field by Magnetic Force Microscopy",
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Tue-5-C2, Sapporo, Japan, July (2005).

98.  Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM '05), Tue-Pos-80, Sapporo, Japan, July (2005).

99.  Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
"Magnetic Field Detection by Magnetic Force Microscopy for Current Mapping with High Spatial Resolution",
13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P314, Stockholm, Sweden, June (2005).

100.   Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Local Mapping of Photovoltages on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), O-141, Stockholm, Sweden, June (2005).

101.   Shiano Ono and Takuji Takahashi:
"A New Approach for Improving Accuracy and Resolution in Surface Potential Measurements by Kelvin Probe Force Microscopy",
13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P312, Stockholm, Sweden, June (2005).

102.   Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Current Evaluation through Current-induced Magnetic Field Detected by Magnetic Force Microscopy",
Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-8, Cancun, Mexico, June (2005).

103.   Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Photovoltage Mapping on Polycrystalline Silicon Solar Cells by AFM with Piezo-resistive Cantilever",
Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-31, Cancun, Mexico, June (2005).

104.   Shiano Ono and Takuji Takahashi:
"Intermittent Bias Application for Accurate Potential Determination in Kelvin Probe Force Microscopy",
Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), Cancun, Mexico, June (2005).

105.   Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
"A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
Scanning Probe Microscopy, Sensors and Nanostructures (Cancun 2005), P-1, Cancun, Mexico, June (2005).

106.   Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Current-induced Magentic Field Detection around Fine Current Paths by Magnetic Force Microscopy",
International Magnetics Conference (INTERMAG 2005), EF-03, Nagoya, Japan, April (2005).

107.   Shiano Ono and Takuji Takahashi:
"Potential Distribution around InAs Quantum Dots Observed by Sampling-and-Hold Kelvin Probe Force Microscopy", 
International Symposium on Quantum Dots and Photonic Crystals 2005 (ISQDPC 2005), P-19, Tokyo, Japan, March (2005).

108.   Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
"Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
The 12th International Colloquium on Scanning Probe Microscopy, S1-4, Atagawa, Japan, December (2004).

109.   Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
The 12th International Colloquium on Scanning Probe Microscopy, S10-5, Atagawa, Japan, December (2004).

110.   Shiano Ono and Takuji Takahashi:
"Sample-and-Hold Kelvin Probe Force Microscopy",
The 12th International Colloquium on Scanning Probe Microscopy, P-55, Atagawa, Japan, December (2004).

111.   Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
"Local Photovoltage Mapping on Polycrystalline Silicon Solar Cells thorough Electrostatic Force Detected by AFM with Piezoresistive Cantilever",
The 12th International Colloquium on Scanning Probe Microscopy, P-57, Atagawa, Japan, December (2004).

112.   Shiano Ono and Takuji Takahashi:
"Sample-and-hold Kelvin probe force microscopy on InAs quantum dots towards accurate potential measurements",
Frontiers in Nanoscale Science and Engineering, P-3, Boston, U.S.A., October (2004).

113.   Kan Takada, Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
"Local Photoabsorption Measurements on InAs Wires by STM and Conductive AFM",
Frontiers in Nanoscale Science and Engineering, P-13, Boston, U.S.A., October (2004).

114.   Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
Frontiers in Nanoscale Science and Engineering, P-19, Boston, U.S.A., October (2004).

115.   Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
"Current-induced magnetic field detection by magnetic force microscopy for current evaluation",
Frontiers in Nanoscale Science and Engineering, P-20, Boston, U.S.A., October (2004).

116.   Masayuki Muranaka and Takuji Takahashi:
"Dual Bias Modulation Method for Differential Conductance Measurements in Scanning Tunneling Spectroscopy",
Frontiers in Nanoscale Science and Engineering, P-21, Boston, U.S.A., October (2004).

117.   Shiano Ono and Takuji Takahashi:
"Precise Potential Determination by Sample-and-Hold Kelvin Probe Force Microscopy",
Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP1, Venice, Italy, June (2004).

118.   Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Operation in Atomic Force Microscopy for Fast Scanning",
Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP2, Venice, Italy, June (2004).

119.   Daisuke Saida and Takuji Takahashi:
"A Novel Method of Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP3, Venice, Italy, June (2004).

120.   Takuji Takahashi and Shiano Ono:
"Sample-and-Hold Atomic Force Microscopy for Fast Operation",
Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).

121.   Shiano Ono and Takuji Takahashi:
"Sample-and-Hold Operation for Potential Determination in Kelvin Probe Force Microscopy",
Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).

122.   Takuji Takahashi, Hiroyuki Masuda, and Misaichi Takeuchi:
"Local Photocurrent Detection on InAs Wires by Conductive AFM",
Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, P.R.China, May (2004).

123.   Daisuke Saida and Takuji Takahashi: 
"Magnetic Field Observation Around a Current Flow by Magnetic Force Microscopy",
The 11th International Colloquium on Scanning Probe Microscopy, S9-4, Atagawa, Japan, December (2003).

124.   Shiano Ono and Takuji Takahashi:
"Size Dependence of Surface Potential on InAs Dots Studied by Kelvin Probe Force Microscopy",
The 11th International Colloquium on Scanning Probe Microscopy, S8-5, Atagawa, Japan, December (2003).

125.   Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
"Local Detection of Photocurrent of InAs Wire by Conductive AFM Tip",
The 11th International Colloquium on Scanning Probe Microscopy, S8-4, Atagawa, Japan, December (2003).

126.   Masayuki Muranaka and Takuji Takahashi:
"Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
The 11th International Colloquium on Scanning Probe Microscopy, P-36, Atagawa, Japan, December (2003).

127.   Shiano Ono and Takuji Takahashi: 
"Size Dependence of Surface Potential on InAs Quantum Dots",
International Symposium on Quantum Dots and Photonic Crystals 2003 (QDPC2003), P-17, Tokyo, Japan, November (2003).

128.   Daisuke Saida and Takuji Takahashi:
"Current-induced Magnetic Field Detection around a GaAs/AlGaAs Mesa Stripe by Magnetic Force Microscopy",
7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-7), 20B56, Nara, Japan, November (2003).

129.   Takuji Takahashi, Shiano Ono, Kan Takada, Daisuke Saida, and Hiroyuki Masuda:
"Nanoscale Characterization of Electronic and Optical Properties in Nanostructures by Scanning Probe Methods",
The 5th International Workshop on Future Information Precessing Technologies (IWFIPT 2003), Miyazaki, Japan, November (2003).

130.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi: 
"Influences of Tip-to-sample Distance on KFM Measurements", 
The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, July (2003).

131.   Daisuke Saida and Takuji Takahashi: 
"Low Current Detection by Magnetic Force Microscopy", 
The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, Netherland, July (2003).

132.   Takuji Takahashi, Kan Takada, Hiroyuki Masuda, and Misaichi Takeuchi:
"Photo-induced Conductance Properties in InAs Nanostructures Studied by STM and AFM under Light Illumination", 
3rd International Symposium on Scanning Probe Spectroscopy and Related Methods (SPS'03), Poznan, Poland, July (2003).

133.   Takuji Takahashi and Daisuke Saida: 
"Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy", 
Oxford 2003: Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, U.K., May (2003).

134.   Takuji Takahashi and Shiano Ono: 
"Influences of Tip-Sample Distance on KFM Measurements", 
Oxford 2003: Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, U.K., May (2003).

135.   Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
"Photo-absorption in InAs Nanostructures Studied by Light-illuminated STM",
2nd International Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, Japan, November (2002).

136.   Daisuke Saida and Takuji Takahashi:
"Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
The 10th International Colloquium on Scanning Probe Microscopy, S2-6, Hawaii, U.S.A., October (2002).

137.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Surface Potential Imaging on InAs Quantum Dots and InAs Thin Films by Kelvin Probe Force Microscopy Operated in High Vacuum",
The 10th International Colloquium on Scanning Probe Microscopy, S6-7, Hawaii, U.S.A., October (2002).

138.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Surface Potential on InAs Quantum Dots Studied by Kelvin Probe Force Microscopy",
2nd International Conference on Semiconductor Quantum Dots (QD2002), G-9, Tokyo, Japan, September (2002).

139.   Shiano Ono, Takuji Takahashi, and Misaichi Takeuchi:
"Kelvin Probe Force Microscopy on Self-assembled InAs Dots and InAs Thin Film",
The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-36, Tsukuba, Japan, September (2002).

140.   Daisuke Saida and Takuji Takahashi:
"Current-induced Magnetic Field around a GaAs Mesa Stripe Studied by Magnetic Force Microscopy",
The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-37, Tsukuba, Japan, September (2002).

141.   Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
"Photoabsorption in Indium Arsenide Nanowires Studied by Light-illuminated STM",
nano-7/ecoss-21: 7th International Conference on Nanometer-scale Science and Technology/21th European Conference on Surface Science, TH-P-026, Malmoe, Sweden, June (2002).

142.   Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
"Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, U.S.A., May (2002).

143.   Takuji Takahashi and Daisuke Saida:
"Current Evaluation through Magnetic Field Measurement by Magnetic Force Microscopy",
Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, P46, Las Vegas, U.S.A., May (2002).

144.   Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
"Surface Potential Measurements on Self-assembled InAs Quantum Dots by Kelvin Probe Force Microscopy",
Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, P65, Las Vegas, U.S.A., May (2002).

145.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Current Imaging on InAs Wires by Contact-mode AFM",
The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (2001).

146.   Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
"Photo-absorption Characterization on Surface InAs Nano-structures Using Light-illuminated STM",
The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (2001).

147.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Conductive AFM Characterization on InAs Wires Formed on (110) GaAs Vicinal Substrates",
28th International Symposium on Compound Semiconductors (ISCS2001), Tokyo, Japan, October (2001).

148.   Kan Takada, Misaichi Takeuchi and Takuji Takahashi:
"Light-illuminated STM Studies on InAs Nano-structures",
The 2001 International Conference on Solid State Devices and Materials (SSDM2001), Tokyo, Japan, September (2001).

149.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Current and Potential Characterization on InAs Wire-like Structures by AFM with a Conductive Tip",
11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Vancouver, Canada, July (2001).

150.   Takuji Takahashi, Shiano Ono, Kan Takada, and Misaichi Takeuchi:
"SPM Characterization of InAs Nano-wires Grown on GaAs (110) Vicinal Substrates"
The First International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '01 (QNN '01), Tsukuba, Japan, July (2001).

151.   Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
"Kelvin Probe Force Microscopy on InAs Nanostructures" (Invited),
Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).

152.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Current and Potential Characterization on InAs Wires by Contact-mode AFM and Kelvin Probe Force Microscopy",
Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).

153.   Kan Takada, Misaichi Takeuchi, and Takuji Takahashi: 
"Surface Electronic Properties on GaAs Covered by InAs Nano-wires Studied by Light-illuminated STM", 
Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, Japan, May (2001).

154.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Surface Potential Measurements on InAs Nanostructures by Kelvin Probe Force Microscopy",
The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, Japan, December (2000).

155.   Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
"Capacitance and Conductance Measurements on Self-Assembled InAs Quantum Dots Studied by Scanning Capacitance Microscopy",
The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, Japan, December (2000).

156.   Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
"Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
SSDM 2000: 2000 International Conference on Solid State Devices and Materials, Sendai, Japan, August (2000).

157.   Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
"Capacitance and Conductance Measurements of embedded InAs Quantum Dots in GaAs",
The 2nd International Conference on Scanning Probe Spectroscopy, Hamburg, Germany, July (2000).

158.   Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
"Kelvin Probe Force Microscopy on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
Heidelberg 2000: Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Heidelberg, Germany, May (2000).

159.   Takuji Takahashi, Takeshi Noda, and Hiroyuki Sakaki:
"Surface Potential Distribution of a Thin InAs Layer on an (110) GaAs Substrate Studied by Kelvin Probe Force Microscopy",
Surfaces and Interfaces of Mesoscopic Devices, Maui, U.S.A., December (1999).

160.   Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
"Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).

161.   Daisuke Yashiki and Takuji Takahashi:
"Scanning Tunneling Spectroscopy on Buried Quantum Well",
The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).

162.   Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
"Local Capacitance Measurement on InAs-covered GaAs Studied by Scanning Capacitance Microscopy",
The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, Japan, December (1999).

163.   Takuji Takahashi, Takeshi Noda, Takashi Kawamukai, and Hiroyuki Sakaki:
"Kelvin Probe Microscopy on InAs Surfaces on (100) and (110) GaAs Substrates", 
Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, WePos1-7, Seoul, Korea, July (1999).

164.   Hiroshi Yamamoto and Takuji Takahashi: 
"Cross-sectional Observation of p-n GaAs Multilayers by STM under Laser Irradiation", 
Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, TuP1-25, Seoul, Korea, July (1999).

165.   Takuji Takahashi and Takashi Kawamukai:
"Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
Seattle'99: Scanning Probe Microscopy, Cantilever Sensors and Nanostructures, Seattle, U.S.A., May (1999).

166.   Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
"Photoinduced Current on InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
The 6th International Colloquium on Scanning Tunneling Microscopy, Atagawa, Japan, December (1998).

167.   Takuji Takahashi, Takashi Kawamukai, Hiroshi Yamamoto, and Itaru Kamiya:
"Near Surface Electrical Characterization of Nanostructures by SPM Technolgies", 
2nd France-Japan Workshop from Nano to Macroscale Science and Technology through Microsystems, Toulouse, France, November (1998).

168.   Takashi Kawamukai, Itaru Kamiya, and Takuji Takahashi:
"Highly Resolved Surface Characterization of InAs-covered GaAs by AFM with a conductive tip", 
25th Internatinal Symposium on Compound Semiconductors, TuP-16, Nara, Japan, October (1998).

169.   Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
"Characterization of InAs dots on n-GaAs by AFM with a conductive tip", 
3rd Conference on Development and Technological Application of Nearfield-Scanning Probe Methods, TueA11, Basel, Switzerland, September (1998).

170.   Takuji Takahashi and Masahiro Yoshita: 
"Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation", 
Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Tu11.2P30, Hamburg, Germany, July (1997).

171.   Takuji Takahashi and Masahiro Yoshita: 
"Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation", 
Fourth International Conference on Nanometer-scale Science and Technology, 7-TuA8, Beijing, P.R.China, September (1996).

172.   Masahiro Yoshita, Takuji Takahashi, and Hiroyuki Sakaki:
"STS Measurements Using Cleaved Semiconductor Tips",
Fourth International Conference on Nanometer-scale Science and Technology, 11-TuP40, Beijing, P.R.China, September (1996).

173.   Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
"Tunneling Characterization of GaAs and InAs by Scanning Tunneling Microscopy under Laser Irradiation", 
Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, 21-ThA10, Aspen, U.S.A., July (1995).

174.   Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
"Laser-assisted STM Observation of GaAs/AlGaAs", 
Second International Colloquium on Scanning Tunneling Microscopy, Kanazawa, Japan, December (1994).

 


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