1. Takuji Takahashi:
    "Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials",
    Proceedings on 6th Pacific Rim Conference on Ceramic and Glass Technology, 163 (2006).
  2. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
    Jpn. J. Appl. Phys., 45, 1931-1933 (2006).
  3. Takatoshi Igarashi, Toru Ujihara and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by Atomic Force Microscopy with Piezo-resistive Cantilever",
    Jpn. J. Appl. Phys., 45, 2128-2131 (2006).
  4. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    Jpn. J. Appl. Phys., 44, 8625-8629 (2005).
  5. Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
    "Local Photocurrent Detection on InAs Wires by Conductive AFM",
    Ultramicroscopy, 105, 137-142 (2005).
  6. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Atomic Force Microscopy for Fast Operation",
    Ultramicroscopy, 105, 42-50 (2005).
  7. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Operation in Kelvin Probe Force Microscopy",
    Jpn. J. Appl. Phys., 44, 6213-6217 (2005).
  8. Takuji Takahashi and Shiano Ono:
    "Tip-to-sample Distance Dependence of an Electrostatic Force in KFM Measurements",
    Ultramicroscopy, 100, 287-292 (2004).
  9. Takuji Takahashi and Daisuke Saida:
    "Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy",
    Ultramicroscopy, 100, 293-299 (2004).
  10. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
    Jpn. J. Appl. Phys., 43, 4612-4614 (2004).
  11. Shiano Ono and Takuji Takahashi:
    "Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy",
    Jpn. J. Appl. Phys., 43, 4639-4642 (2004).
  12. Daisuke Saida and Takuji Takahashi:
    "Magnetic Field Observation Around Current Path by Magnetic Force Microscopy",
    Jpn. J. Appl. Phys., 43, 4643-4646 (2004).
  13. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging for Fast Scanning in Atomic Force Microscopy",
    Jpn. J. Appl. Phys., 43, L582-L584 (2004).
  14. Shiano Ono, Misaichi Takeuchi, T. Noda, and Takuji Takahashi:
    "Surface Potential Imaging on InAs Low-Dimensional Nanostructures Studied by Kelvin Prove Force Microscopy",
    Jpn. J. Appl. Phys., 42, 4869-4873 (2003).
  15. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
    Jpn. J. Appl. Phys., 42, 4874-4877 (2003).
  16. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
    Ultramicroscopy, 97, 1-6 (2003).
  17. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Photoabsorption Characterization on Surface InAs Nanostructures Using Light-Illuminated Scanning Tunneling Microscope",
    Jpn. J. Appl. Phys., 41, 4990-4993 (2002).
  18. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Nanowires by Contact-mode Atomic Force Microscopy and Kelvin Probe Force Microscopy",
    Ultramicroscopy, 91, 127-132 (2002).
  19. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Kelvin Probe Force Microscopy on InAs Thin Films Grown on GaAs Giant Step Structures Formed on (110) GaAs Vicinal Substrates",
    Appl. Phys. Lett., 78, 1086-1088 (2001).
  20. Hiroshi Yamamoto, Takuji Takahashi, and Itaru Kamiya:
    "Local Capacitance Measurements on InAs dot-covered GaAs Surfaces by Scanning Capacitance Microscopy",
    Appl. Phys. Lett., 77, 1994-1996 (2000).
  21. Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
    "Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
    Jpn. J. Appl. Phys., 39, 3721-3723 (2000).
  22. Takuji Takahashi and Takashi Kawamukai:
    "Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
    Ultramicroscopy, 82, 63-68 (2000).
  23. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Electrostatic Force Characterization on InAs Dot-covered n-type (001) GaAs Surfaces by Contact-mode Atomic Force Microscopy with a Conductive Tip",
    Appl. Phys. Lett., 75, 510-512 (1999).
  24. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Characterization of InAs Dots on n-GaAs by AFM with a Conductive Tip",
    Surface and Interface Analysis, 27, 547-549 (1999).
  25. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Photoinduced Current Properties of InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
    Jpn. J. Appl. Phys., 38, 3871-3874 (1999).
  26. Takuji Takahashi, Masahiro Yoshita, Itaru Kamiya, and Hiroyuki Sakaki:
    "Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation",
    Appl. Phys. A, 66, S1055-S1058 (1998).
  27. Takuji Takahashi and Masahiro Yoshita:
    "Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation",
    Appl. Phys. Lett., 70, 2162-2164 (1997).
  28. Masahiro Yoshita and Takuji Takahashi:
    "Characterization of Cleaved GaAs Tips for Scanning Tunneling Microscopy",
    Jpn. J. Appl. Phys., 36, 6957-6961 (1997).
  29. Masahiro Yoshita and Takuji Takahashi:
    "Photoreflectance Spectra from a Surface and an Interface of n-type GaAs Epitaxial Layers and Their Modulation Frequency Dependence",
    Appl. Surf. Sci., 115, 347-354 (1997).
  30. Takuji Takahashi and Masahiro Yoshita:
    "Laser Irradiation Effects on Tunneling Properties of n-type GaAs and InAs by Scanning Tunneling Microscopy",
    Appl. Phys. Lett., 68, 3479-3481 (1996).
  31. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Scanning Tunneling Microscopy of Undoped GaAs/AlGaAs Heterostructures under Laser Irradiation",
    Appl. Phys. Lett., 68, 502-504 (1996).

Štop

  1. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada and Takuji Takahashi:
    "Quantitative Current Evaluation around Artificial Current Networks by Magnetic Force Microscopy",
    Nano and Giga Challenges in Electronics and Photonics (NGC2007), Phoenix, March (2007).
  2. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi and Toru Ujihara:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    Nano and Giga Challenges in Electronics and Photonics (NGC2007), Phoenix, March (2007).
  3. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    14th International Colloquium on Scanning Probe Microscopy (ICSPM14), S10-3, Atagawa, December (2006).
  4. Masaki Takihara, Toru Ujihara and Takuji Takahashi:
    "Local Measurements of Minority Carrier Diffusion Length in Polycrystalline Silicon Solar Cells by Kelvin Probe Force Microscopy",
    14th International Colloquium on Scanning Probe Microscopy (ICSPM14), S4-35p, Atagawa, December (2006).
  5. Masaki Takihara, Takatoshi Igarashi, Toru Ujihara and Takuji Takahashi:
    "Local Characterization of Photovoltage on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    International Conference on Solid State Devices and Materials (SSDM2006), P-9-9, Yokohama, September (2006).
  6. Takuji Takahashi, Daisuke Saida, Tomohiko Edura, Ken Tsutsui and Yasuo Wada:
    "Magnetic Force Microscopy around Artificial Current Networks for Quantitative Evaluation of Current",
    International Conference on Nanoscience and Technology (ICN&T 2006), P689, Basel, August (2006).
  7. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi and Toru Ujihara:
    "Local Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    International Conference on Nanoscience and Technology (ICN&T 2006), P634, Basel, August (2006).
  8. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada and Takuji Takahashi:
    "Quantitative Current Evaluation through Magnetic Field Detection by Magnetic Force Microscopy",
    Asia-Pacific Symposium on Applied Electromagnetics and Mechanics, B2-2, Sydney, July (2006).
  9. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada and Takuji Takahashi:
    "Quantitative Evaluation of Current by Magnetic Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier2006), Montpellier, June (2006) [Invited].
  10. Takuji Takahashi, Masaki Takihara, Takatoshi Igarashi and Toru Ujihara:
    "Photovoltage Measurements on Polycrystalline Silicon Solar Cells by KFM with Piezo-resistive Cantilever",
    Scanning Probe Microscopy, Sensors and Nanostructures (Montpellier2006), SPM-16, Montpellier, June (2006).
  11. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada and Takuji Takahashi:
    "Quantitative Evaluation of Current through Magnetic Field Observation by Magnetic Force Microscopy",
    International Magnetics Conference (Intermag 2006), HD-06, San Diego, May (2006).
  12. Takuji Takahashi, Shiano Ono, Daisuke Saida, and Takatoshi Igarashi:
    "Nano-probing Techniques for Electrical and Optical Characterization of Nanostructures",
    International Symposium on Advanced Electronics for Future Generations, 1.6, Tokyo, October (2005).
  13. Takuji Takahashi:
    "Scanning Probe Methods for Characterization of Electrical Properties in Nano-materials" (Invited),
    6th Pacific Rim Conference on Ceramic and Glass Technology (PacRim6), PACRIM-EL2-6-2005, Maui, September (2005).
  14. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Quantitativeness in current evaluation through current-induced magnetic field detection by magnetic force microscopy",
    The 23rd European Conference on Surface Science (ECOSS 23), Appl22, Berlin, September (2005).
  15. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application in Kelvin Probe Force Microscopy for Accurate Determination of Surface Potential",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'05), Mon-5-C4, Sapporo, July (2005).
  16. Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
    "A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'05), Mon-Pos-67, Sapporo, July (2005).
  17. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Ability in Quantitative Measurement of Current-Induced Magnetic Field by Magnetic Force Microscopy",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'05), Tue-5-C2, Sapporo, July (2005).
  18. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
    13th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'05), Tue-Pos-80, Sapporo, July (2005).
  19. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui, and Yasuo Wada:
    "Magnetic Field Detection by Magnetic Force Microscopy for Current Mapping with High Spatial Resolution",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P314, Stockholm, June (2005).
  20. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Local Mapping of Photovoltages on Polycrystalline Silicon Solar Cells through Potential Measurements by AFM with Piezo-resistive Cantilever",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), O-141, Stockholm, June (2005).
  21. Shiano Ono and Takuji Takahashi:
    "A New Approach for Improving Accuracy and Resolution in Surface Potential Measurements by Kelvin Probe Force Microscopy",
    13th International Congress on Thin Films / 8th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ICTF 13/ACSIN 8), P312, Stockholm, June (2005).
  22. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Current Evaluation through Current-induced Magnetic Field Detected by Magnetic Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun2005), P-8, Cancun, June (2005).
  23. Takatoshi Igarashi, Toru Ujihara, and Takuji Takahashi:
    "Photovoltage Mapping on Polycrystalline Silicon Solar Cells by AFM with Piezo-resistive Cantilever",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun2005), P-31, Cancun, June (2005).
  24. Shiano Ono and Takuji Takahashi:
    "Intermittent Bias Application for Accurate Potential Determination in Kelvin Probe Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun2005), Cancun, June (2005).
  25. Masaru Ikeda, Shiano Ono, and Takuji Takahashi:
    "A Numerical Estimation Method for Potential Determination in Kelvin Probe Force Microscopy",
    Scanning Probe Microscopy, Sensors and Nanostructures (Cancun2005), P-1, Cancun, June (2005).
  26. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Current-induced Magentic Field Detection around Fine Current Paths by Magnetic Force Microscopy",
    International Magnetics Conference (INTERMAG 2005), EF-03, Nagoya, April (2005).
  27. Shiano Ono and Takuji Takahashi:
    "Potential Distribution around InAs Quantum Dots Observed by Sampling-and-Hold Kelvin Probe Force Microscopy",
    International Symposium on Quantum Dots and Photonic Crystals 2005 (ISQDPC 2005), P-19, Tokyo, March (2005).
  28. Daisuke Saida, Tomohiko Edura, Ken Tsutsui, Yasuo Wada, and Takuji Takahashi:
    "Investigation of the Spatial Resolution in the Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    The 12th International Colloquium on Scanning Probe Microscopy, S1-4, Atagawa, December (2004).
  29. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
    The 12th International Colloquium on Scanning Probe Microscopy, S10-5, Atagawa, December (2004).
  30. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Kelvin Probe Force Microscopy",
    The 12th International Colloquium on Scanning Probe Microscopy, P-55, Atagawa, December (2004).
  31. Takatoshi Igarashi, Tohru Ujihara and Takuji Takahashi:
    "Local Photovoltage Mapping on Polycrystalline Silicon Solar Cells thorough Electrostatic Force Detected by AFM with Piezoresistive Cantilever",
    The 12th International Colloquium on Scanning Probe Microscopy, P-57, Atagawa, December (2004).
  32. Shiano Ono and Takuji Takahashi:
    "Sample-and-hold Kelvin probe force microscopy on InAs quantum dots towards accurate potential measurements",
    Frontiers in Nanoscale Science and Engineering, P-3, Boston, October (2004).
  33. Kan Takada, Hiroyuki Masuda, Misaichi Takeuchi and Takuji Takahashi:
    "Local Photoabsorption Measurements on InAs Wires by STM and Conductive AFM",
    Frontiers in Nanoscale Science and Engineering, P-13, Boston, October (2004).
  34. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Imaging in Atomic Force Microscopy for Fast Scanning",
    Frontiers in Nanoscale Science and Engineering, P-19, Boston, October (2004).
  35. Daisuke Saida, Takuji Takahashi, Tomohiko Edura, Ken Tsutsui and Yasuo Wada:
    "Current-induced magnetic field detection by magnetic force microscopy for current evaluation",
    Frontiers in Nanoscale Science and Engineering, P-20, Boston, October (2004).
  36. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Differential Conductance Measurements in Scanning Tunneling Spectroscopy",
    Frontiers in Nanoscale Science and Engineering, P-21, Boston, October (2004).
  37. Shiano Ono and Takuji Takahashi:
    "Precise Potential Determination by Sample-and-Hold Kelvin Probe Force Microscopy",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP1, Venice, June (2004).
  38. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Operation in Atomic Force Microscopy for Fast Scanning",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP2, Venice, June (2004).
  39. Daisuke Saida and Takuji Takahashi:
    "A Novel Method of Current-Induced Magnetic Field Detection by Magnetic Force Microscopy",
    Joint Conference of 16th International Vacuum Congress (IVC-16), 12th International Conference on Solid Surfaces (ICSS-12), 8th International Conference on Nanometer-Scale Science and Technology (NANO-8), and 17th Vacuum National Symposium (AIV-17), AS+SE-ThP3, Venice, June (2004).
  40. Takuji Takahashi and Shiano Ono:
    "Sample-and-Hold Atomic Force Microscopy for Fast Operation",
    Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, May (2004).
  41. Shiano Ono and Takuji Takahashi:
    "Sample-and-Hold Operation for Potential Determination in Kelvin Probe Force Microscopy",
    Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, May (2004).
  42. Takuji Takahashi, Hiroyuki Masuda, and Misaichi Takeuchi:
    "Local Photocurrent Detection on InAs Wires by Conductive AFM",
    Beijing - TEDA 2004: Scanning Probe Microscopy, Sensors and Nanostructures, Tianjin, May (2004).
  43. Daisuke Saida and Takuji Takahashi:
    "Magnetic Field Observation Around a Current Flow by Magnetic Force Microscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, S9-4, Atagawa, December (2003).
  44. Shiano Ono and Takuji Takahashi:
    "Size Dependence of Surface Potential on InAs Dots Studied by Kelvin Probe Force Microscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, S8-5, Atagawa, December (2003).
  45. Hiroyuki Masuda, Misaichi Takeuchi, and Takuji Takahashi:
    "Local Detection of Photocurrent of InAs Wire by Conductive AFM Tip",
    The 11th International Colloquium on Scanning Probe Microscopy, S8-4, Atagawa, December (2003).
  46. Masayuki Muranaka and Takuji Takahashi:
    "Dual Bias Modulation Method for Scanning Tunneling Spectroscopy",
    The 11th International Colloquium on Scanning Probe Microscopy, P-36, Atagawa, December (2003).
  47. Shiano Ono and Takuji Takahashi:
    "Size Dependence of Surface Potential on InAs Quantum Dots",
    International Symposium on Quantum Dots and Photonic Crystals 2003 (QDPC2003), P-17, Tokyo, November (2003).
  48. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection around a GaAs/AlGaAs Mesa Stripe by Magnetic Force Microscopy",
    7th International Conference on Atomically Controlled Surfaces, Interfaces and Nanostructures (ACSIN-7), 20B56, Nara, November (2003).
  49. Takuji Takahashi, Shiano Ono, Kan Takada, Daisuke Saida, and Hiroyuki Masuda:
    "Nanoscale Characterization of Electronic and Optical Properties in Nanostructures by Scanning Probe Methods",
    The 5th International Workshop on Future Information Precessing Technologies (IWFIPT 2003), Miyazaki, November (2003).
  50. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Influences of Tip-to-sample Distance on KFM Measurements",
    The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, July (2003).
  51. Daisuke Saida and Takuji Takahashi:
    "Low Current Detection by Magnetic Force Microscopy",
    The 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM'03), Eindhoven, July (2003).
  52. Takuji Takahashi, Kan Takada, Hiroyuki Masuda, and Misaichi Takeuchi:
    "Photo-induced Conductance Properties in InAs Nanostructures Studied by STM and AFM under Light Illumination",
    3rd International Symposium on Scanning Probe Spectroscopy and Related Methods (SPS'03), Poznan, July (2003).
  53. Takuji Takahashi and Daisuke Saida:
    "Magnetic Field Detection for Current Evaluation by Magnetic Force Microscopy",
    Oxford 2003: Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, May (2003).
  54. Takuji Takahashi and Shiano Ono:
    "Influences of Tip-Sample Distance on KFM Measurements",
    Oxford 2003: Scanning Probe Microscopy, Sensors and Nanostructures, Oxford, May (2003).
  55. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Photo-absorption in InAs Nanostructures Studied by Light-illuminated STM",
    2nd International Workshop on Nano-scale Spectroscopy and Nanotechnology, Tokyo, November (2002).
  56. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field Detection by Magnetic Force Microscopy around a GaAs/AlGaAs Mesa Stripe",
    The 10th International Colloquium on Scanning Probe Microscopy, S2-6, Hawaii, October (2002).
  57. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential Imaging on InAs Quantum Dots and InAs Thin Films by Kelvin Prove Force Microscopy Operated in High Vacuum",
    The 10th International Colloquium on Scanning Probe Microscopy, S6-7, Hawaii, October (2002).
  58. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential on InAs Quantum Dots Studied by Kelvin Probe Force Microscopy",
    2nd International Conference on Semiconductor Quantum Dots (QD2002), G-9, Tokyo, September (2002).
  59. Shiano Ono, Takuji Takahashi, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on Self-assembled InAs Dots and InAs Thin Film",
    The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-36, Tsukuba, September (2002).
  60. Daisuke Saida and Takuji Takahashi:
    "Current-induced Magnetic Field around a GaAs Mesa Stripe Studied by Magnetic Force Microscopy",
    The Second International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '02 (QNN '02), TuP-37, Tsukuba, September (2002).
  61. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Photoabsorption in Indium Arsenide Nanowires Studied by Light-illuminated STM",
    nano-7/ecoss-21: 7th International Conference on Nanometer-scale Science and Technology/21th European Conference on Surface Science, TH-P-026, Malmoe, June (2002).
  62. Takuji Takahashi, Kan Takada, and Misaichi Takeuchi:
    "Light-illuminated STM Studies on Photoabsorption in InAs Nanowires",
    Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, Las Vegas, May (2002).
  63. Takuji Takahashi and Daisuke Saida:
    "Current Evaluation through Magnetic Field Measurement by Magnetic Force Microscopy",
    Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, P46, Las Vegas, May (2002).
  64. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Surface Potential Measurements on Self-assembled InAs Quantum Dots by Kelvin Probe Force Microscopy",
    Las Vegas 2002: Scanning Probe Microscopy, Sensors and Nanostructures, P65, Las Vegas, May (2002).
  65. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current Imaging on InAs Wires by Contact-mode AFM",
    The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, December (2001).
  66. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Photo-absorption Characterization on Surface InAs Nano-structures Using Light-illuminated STM",
    The 9th International Colloquium on Scanning Probe Microscopy, Atagawa, December (2001).
  67. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Conductive AFM Characterization on InAs Wires Formed on (110) GaAs Vicinal Substrates",
    28th International Symposium on Compound Semiconductors (ISCS2001), Tokyo, October (2001).
  68. Kan Takada, Misaichi Takeuchi and Takuji Takahashi:
    "Light-illuminated STM Studies on InAs Nano-structures",
    The 2001 International Conference on Solid State Devices and Materials (SSDM2001), Tokyo, September (2001).
  69. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Wire-like Structures by AFM with a Conductive Tip",
    11th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Vancouver, July (2001).
  70. Takuji Takahashi, Shiano Ono, Kan Takada, and Misaichi Takeuchi:
    "SPM Characterization of InAs Nano-wires Grown on GaAs (110) Vicinal Substrates"
    The First International Workshop on Quantum Nonplanar Nanostructures & Nanoelectronics '01 (QNN '01), Tsukuba, July (2001).
  71. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on InAs Nanostructures",
    Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, May (2001) (Invited).
  72. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Current and Potential Characterization on InAs Wires by Contact-mode AFM and Kelvin Probe Force Microscopy",
    Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, May (2001).
  73. Kan Takada, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Electronic Properties on GaAs Covered by InAs Nano-wires Studied by Light-illuminated STM",
    Tokyo-2001: Scanning Probe Microscopy, Sensors, and Nanostructures, Makuhari, May (2001).
  74. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Surface Potential Measurements on InAs Nanostructures by Kelvin Probe Force Microscopy",
    The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, December (2000).
  75. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Capacitance and Conductance Measurements on Self-Assembled InAs Quantum Dots Studied by Scanning Capacitance Microscopy",
    The 8th International Colloquium on Scanning Probe Microscopy and Asian SPM (3), Atagawa, December (2000).
  76. Shiano Ono, Misaichi Takeuchi, and Takuji Takahashi:
    "Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
    SSDM 2000: 2000 International Conference on Solid State Devices and Materials,
    Sendai, August (2000).
  77. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Capacitance and Conductance Measurements of embedded InAs Quantum Dots in GaAs",
    The 2nd International Conference on Scanning Probe Spectroscopy, Hamburg, July (2000).
  78. Takuji Takahashi, Shiano Ono, and Misaichi Takeuchi:
    "Kelvin Probe Force Microscopy on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates",
    Heidelberg 2000: Scanning Probe Microscopy, Cantilever Sensors and Nanostructures,
    Heidelberg, May (2000).
  79. Takuji Takahashi, Takeshi Noda, and Hiroyuki Sakaki:
    "Surface Potential Distribution of a Thin InAs Layer on an (110) GaAs Substrate Studied by Kelvin Probe Force Microscopy",
    Surfaces and Interfaces of Mesoscopic Devices, Maui, December (1999).
  80. Takuji Takahashi, Takashi Kawamukai, Shiano Ono, Takeshi Noda, and Hiroyuki Sakaki:
    "Kelvin Probe Force Microscopy on InAs Thin Films on (110) GaAs Substrates",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, December (1999).
  81. Daisuke Yashiki and Takuji Takahashi:
    "Scanning Tunneling Spectroscopy on Buried Quantum Well",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, December (1999).
  82. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Local Capacitance Measurement on InAs-covered GaAs Studied by Scanning Capacitance Microscopy",
    The 7th International Colloquium on Scanning Probe Microscopy, Atagawa, December (1999).
  83. Takuji Takahashi, Takeshi Noda, Takashi Kawamukai, and Hiroyuki Sakaki:
    "Kelvin Probe Microscopy on InAs Surfaces on (100) and (110) GaAs Substrates",
    Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, July, WePos1-7 (1999).
  84. Hiroshi Yamamoto and Takuji Takahashi:
    "Cross-sectional Observation of p-n GaAs Multilayers by STM under Laser Irradiation",
    Tenth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Seoul, July, TuP1-25 (1999).
  85. Takuji Takahashi and Takashi Kawamukai:
    "Phase Detection of Electrostatic Force by AFM with a Conductive Tip",
    Seattle'99: Scanning Probe Microscopy, Cantilever Sensors and Nanostructures,
    Seattle, May (1999).
  86. Hiroshi Yamamoto, Itaru Kamiya, and Takuji Takahashi:
    "Photoinduced Current on InAs-covered GaAs Studied by Scanning Tunneling Microscopy",
    The 6th International Colloquium on Scanning Tunneling Microscopy, Atagawa, December (1998).
  87. Takuji Takahashi, Takashi Kawamukai, Hiroshi Yamamoto, and Itaru Kamiya:
    "Near Surface Electrical Characterization of Nanostructures by SPM Technolgies",
    2nd France-Japan Workshop from Nano to Macroscale Science and Technology through Microsystems, Toulouse, November (1998).
  88. Takashi Kawamukai, Itaru Kamiya, and Takuji Takahashi:
    "Highly Resolved Surface Characterization of InAs-covered GaAs by AFM with a conductive tip",
    25th Internatinal Symposium on Compound Semiconductors, Nara, October, TuP-16 (1998).
  89. Takuji Takahashi, Takashi Kawamukai, and Itaru Kamiya:
    "Characterization of InAs dots on n-GaAs by AFM with a conductive tip",
    3rd Conference on Development and Technological Application of Nearfield-Scanning Probe Methods, Basel, September, TueA11 (1998).
  90. Takuji Takahashi and Masahiro Yoshita:
    "Tunneling Spectroscopic Study of InAs-covered GaAs under Laser Irradiation",
    Ninth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Hamburg, July, Tu11.2P30 (1997).
  91. Takuji Takahashi and Masahiro Yoshita:
    "Scanning Tunneling Spectroscopy of n-type GaAs under Laser Irradiation",
    Fourth International Conference on Nanometer-scale Science and Technology, Beijing, September, 7-TuA8 (1996).
  92. Masahiro Yoshita, Takuji Takahashi, and Hiroyuki Sakaki:
    "STS Measurements Using Cleaved Semiconductor Tips",
    Fourth International Conference on Nanometer-scale Science and Technology, Beijing, September, 11-TuP40 (1996).
  93. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Tunneling Characterization of GaAs and InAs by Scanning Tunneling Microscopy under Laser Irradiation",
    Eighth International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques, Colorado, July, 21-ThA10 (1995).
  94. Takuji Takahashi, Masahiro Yoshita, and Hiroyuki Sakaki:
    "Laser-assisted STM Observation of GaAs/AlGaAs",
    Second International Colloquium on Scanning Tunneling Microscopy, Kanazawa, December (1994).
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